Overview
IEC TS 62804-1-1:2020 - Photovoltaic (PV) modules: Test methods for detection of potential-induced degradation - Part 1-1: Crystalline silicon – Delamination defines a standardized, accelerated test protocol for detecting potential-induced degradation - delamination (PID-d) in the laminate of crystalline silicon PV modules (principally those with one or two glass faces). The specification focuses on delamination driven by current transfer between the module cell circuit and grounded surfaces when exposed to system voltage and moisture (damp heat). Note: assessment of power loss from PID (PID-s or PID-p) is outside the scope of this document.
Key topics and requirements
- Test purpose: Evaluate susceptibility of crystalline silicon modules to PID-d (laminate delamination) caused by electrochemical activity under voltage and humidity stress.
- Test sequence: Defined flow including initial visual inspection, wet leakage current measurement, damp heat exposure, voltage stress in both polarities, a repeat wet leakage current test, and final visual inspection.
- Stress factors actuated: Reduced adhesion from damp heat, sodium accumulation at interfaces, and cathodic gas evolution in the cell circuit, metallization, and internal components.
- Sample handling: Specified sampling and conditioning procedures for module specimens suitable for climatic chamber testing.
- Apparatus and procedure: Requirements for environmental chamber profiles, voltage stress equipment, and documented severities (test time–temperature–humidity–voltage profiles) to accelerate and reveal delamination modes.
- Reporting: Mandatory elements for the test report, including visual evidence and electrical leakage data.
- Scope limitations: Primarily targets modules with glass faces; does not address mounting or grounding mitigations and does not quantify field acceleration factors.
Practical applications
- Quality control and type approval testing to detect PID-d vulnerabilities in module designs and material selections.
- Product development and materials screening to reduce delamination risk (encapsulant choices, metallization, glass conductivity).
- Failure analysis and warranty investigations where delamination is suspected to be voltage- or moisture-driven.
- Benchmarking and supplier audits to verify manufacturing consistency and long-term durability.
Who should use this standard
- PV module manufacturers and materials suppliers
- Independent test laboratories and certification bodies
- Design and reliability engineers in the solar industry
- Warranty managers and procurement teams evaluating module durability
Related standards
- IEC TS 62804-1 - PID tests for power loss modes in crystalline silicon (complements this delamination-focused TS)
- IEC TS 62804-2 - PID tests for thin-film and moisture-sensitive packaging
- IEC TS 62941 - Internal quality assurance practices (referenced for periodic retesting guidance)
Keywords: IEC TS 62804-1-1:2020, PID-d, delamination, photovoltaic modules, crystalline silicon, damp heat, voltage stress, PV test methods.