Overview
IEC TS 63164-1:2020 provides guidance for the assurance and presentation of reliability data for industrial automation devices and systems. It helps device manufacturers, assessors and system integrators document how reliability figures were obtained so that these figures can be trusted, verified and used consistently in system-level dependability assessments.
Key topics
- Sources of reliability data - three recognized acquisition methods:
- Calculation (preferred for electronic devices): guidance on how to specify calculation methods.
- Field observations (preferred when calculation data are unavailable): how to describe observed failures and evaluations.
- Laboratory tests (preferred for mechanical/electromechanical devices): how to specify tests and test conditions. Note: laboratory durability tests are not considered suitable for devices operating in the low-demand mode.
- Assurance of reliability data - documenting supporting information so reliability metrics can be trusted, verified and audited.
- Form for presenting data - the document defines how reliability data and its source should be presented to users.
- Statistical and analytical considerations - references and annex guidance on calculating MTTF/MTBF from failure rate (λ) and use of methods such as Weibull analysis.
- Distinguishing failure types - guidance on separating random hardware failures from systematic failures when collecting and evaluating field data.
- Scope limitations - components are assumed not to require a break-in phase; functional safety applications must consider IEC 61508 requirements.
Applications
- Provides a standardized way for manufacturers to publish reliability data that system integrators and assessors can use without ambiguity.
- Helps system integrators and reliability engineers combine device-level data into system-level dependability predictions.
- Supports certification bodies and functional safety practitioners by clarifying evidence and assumptions behind reliability figures used in safety-related assessments.
- Useful for planning field data collection programs, designing laboratory durability tests, and documenting calculation methods for electronic components.
Practical value
- Ensures transparency about data origin (calculation, field, lab) and reference conditions, enabling consistent comparison and aggregation of reliability metrics.
- Reduces uncertainty in system dependability assessments by standardizing data presentation and assurance information.
- Provides practical annexes with methods for field data collection, MTTF/MTBF calculation, and failure classification to support implementation.
Related standards
- IEC 61508 (functional safety) - applicable when devices are used in safety applications
- IEC 60300-3-2 - collection of dependability data from the field
- IEC 60300-3-5 - reliability test conditions and statistical test principles
- IEC 61649 - Weibull analysis
Keywords: IEC TS 63164-1:2020, reliability of industrial automation devices, automation device reliability data, MTTF, MTBF, Weibull analysis, IEC 61508, field data collection, laboratory durability tests, reliability assurance.