ISO 17297:2025
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 14
- Дата публикации:
- 26 мая 2025 г.
- Издание:
- ISO IS 17297 edition 1 version 1
- ICS:
- 01.040.37
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).
Abstract
Overview
ISO 17297:2025 - "Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary" is an international vocabulary standard that defines the most commonly used terms for preparing transmission electron microscopy (TEM) specimens using focused ion beam (FIB) techniques. Published by ISO and prepared by ISO/TC 202/SC 01, the document standardizes terminology across FIB, FIB‑SEM and TEM specimen‑preparation workflows to reduce miscommunication and support consistent reporting and training.
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