ISO TS 80004-6:2013
Nanotechnologies - Vocabulary - Part 6: Nano-object characterization
Nanotechnologies - Vocabulary - Part 6: Nano-object characterization
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 24
- Дата публикации:
- 14 октября 2013 г.
- Издание:
- IEC TS 80004 edition 1 version 1
- ICS:
- 01.040.07
ISO/TS 80004-6:2013 lists terms and definitions relevant to the characterization of nano-objects.
Abstract
Overview
ISO/TS 80004-6:2013 - Nanotechnologies - Vocabulary - Part 6: Nano-object characterization is a Technical Specification developed jointly by ISO (TC 229) and IEC (TC 113). It provides standardized terms and definitions used for the measurement and characterization of nano-objects (materials with one, two or three external dimensions in the nanoscale, ~1–100 nm). As a vocabulary document, its primary purpose is to enable clear communication, reproducibility and comparability of characterization data across research, industry and regulatory contexts.
Key topics
The specification organizes terms under concise, application-oriented headings and defines measurands and techniques commonly used in nano-object characterization:
- General terms: nanoscale, nano-object, nanoparticle, nanofibre, nanoplate, nanotube, quantum dot, particle, agglomerate, aggregate, aerosol, suspension.
- Size and shape measurands: particle size, particle size distribution, particle shape, aspect ratio, equivalent diameter, radius of gyration.
- Scattering and diffraction techniques: small angle neutron scattering (SANS), small angle X‑ray scattering (SAXS), neutron diffraction - including typical angular/length-scale notes for SANS/SAXS as used in nano-characterization.
- Measurement technique categories (alphabetical list of main current techniques): AFM, CLS, DMAS, DLS, SEM, PTA, TEM (size, shape), BET (surface area), SIMS/XPS (surface chemistry), ICP‑MS/NMR (bulk chemistry), zeta potential (charge in suspensions).
- Other measurement topics: aerosol characterization, separation techniques, microscopy, surface area measurement, chemical analysis, mass, crystallinity, charge in suspensions.
- Supporting material: an informative index (Annex A) and bibliography.
Note: the document highlights that many techniques require non‑native sample preparation (placing particles on surfaces, in fluids or vacuum), which can alter nano-object behaviour - an important caveat for data interpretation.
Applications and who uses it
ISO/TS 80004-6 is aimed at anyone involved in nano-object characterization or using characterization data:
- Materials scientists, chemists, physicists, biologists conducting experiments and reporting results.
- Engineers and product developers performing quality control and R&D on nano-enabled materials.
- Regulators, toxicologists and risk assessors who require consistent definitions for reporting and compliance.
- Metrology labs and instrument manufacturers seeking common terminology across techniques (e.g., DLS, TEM, SAXS) for method descriptions and calibration.
Practical benefits include improved reproducibility, clearer method comparison, harmonized reporting and reduced ambiguities in cross-disciplinary communication.
Related standards
- Other parts of ISO/TS 80004 series (Part 1 core terms; Parts on carbon nano-objects, nanostructured materials, nano/bio interface, etc.).
- Technique-specific standards cited within (e.g., ISO 26824, ISO 9276‑1) for detailed measurement procedures and reporting.
Технические детали
- Технический комитет
- TC 113 - Nanotechnology for electrotechnical products and systems
- SKU
- ISO TS 80004-6:2013
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