SIST ISO 5436-1:2002

Name: SIST ISO 5436-1:2002 — Geometrical Product Specifications (GPS) -- Surface texture: Profile method; Measurement standards -- Part 1: Material measures
SKU: SIST ISO 5436-1:2002
Price: 25200 RUB
Availability: InStock

Geometrical Product Specifications (GPS) -- Surface texture: Profile method; Measurement standards -- Part 1: Material measures

Название (английский):

Geometrical Product Specifications (GPS) -- Surface texture: Profile method; Measurement standards -- Part 1: Material measures

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 14
Дата публикации:: 1 июля 2002 г.
ICS:: 17.040.30
Технический комитет:: ISEL - Mechanical elements

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Описание (английский):

La présente partie de l'ISO 5436 spécifie les caractéristiques des mesures matérialisées utilisées comme étalons pour l'étalonnage des caractéristiques métrologiques des instruments de mesure d'état de surface par la méthode du profil, comme défini dans l'ISO 3274.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

ISO 5436-1:2000 - "Geometrical Product Specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 1: Material measures" specifies the characteristics of material measures (formerly called calibration specimens) used as measurement standards for calibration of instruments that measure surface texture by the profile method. The standard defines design requirements, types of standards (A–E), metrological characteristics and the content of measurement standard certificates. It is a GPS standard intended to support traceable calibration and verification of stylus and profile-based instruments.

Key topics and requirements

Design requirements

Material must be hard enough for service life and have a smooth, flat surface so it does not affect evaluation.
Measurement window must accommodate traversal length needed for calibration.

Five measurement standard types (A–E) and their purposes:

Type A - Depth measurement standards (A1: wide grooves with flat bottoms; A2: wide grooves with rounded bottoms) for vertical profile calibration.
Type B - Tip condition standards (B1, B2, B3) to assess stylus tip condition and sensitivity (e.g., B3 can use fine protruding edges such as uncoated razor blades ~0.1 µm edge width).
Type C - Spacing measurement standards with repetitive groove waveforms (sinusoidal, triangular, arcuate) to test transmission characteristics across spacings and amplitudes.
Type D - Roughness measurement standards (D1, D2) for overall instrument calibration using irregular profiles.
Type E - Profile coordinate standards (E1: precision sphere/hemisphere; E2: precision prism) to calibrate the profile coordinate system.

Metrological characteristics: Descriptions of parameters (depth, radius, Ra, RSm, apex angles), the basis of assessment per type, and certificate content requirements.

Normative references: Links to ISO 3274, 4287, 4288, 12085, ISO 5436-2 and uncertainty guidance (GUM, VIM).

Applications and practical value

Ensures traceable calibration of profilometers, stylus instruments and other profile-based surface texture measurement systems.

Helps laboratories and manufacturers validate vertical and horizontal profile components, stylus condition, spatial resolution, and overall roughness performance.

Applicable in quality control, metrology laboratories, instrument manufacturers, and industries with tight surface texture requirements (precision manufacturing, automotive, aerospace, medical devices).

Related standards

ISO 5436-2 (software measurement standards)

ISO 3274, ISO 4287, ISO 4288, ISO 12085 (profile method and parameters)

GUM and VIM for uncertainty and metrology vocabulary

Keywords: ISO 5436-1:2000, surface texture, profile method, measurement standards, material measures, calibration, stylus instruments, profilometer, GPS, roughness.

SIST ISO 5436-1:2002

Abstract

Похожие стандарты

Overview

Key topics and requirements

Applications and practical value

Who should use this standard

Related standards

Технические детали

ISO 5436-1:2000

Geometrical Product Specifications (GPS) — Surface texture: Profile method; Measurement standards — Part 1: M…

ISO 3274:1996/Cor 1:1998

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Nominal characteristics of conta…

SIST EN ISO 5436-2:2013

Geometrical product specifications (GPS) - Surface texture: Profile method; Measurement standards - Part 2: S…

ISO 4287:1997/Amd 1:2009

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface t…

ISO 4288:1996/Cor 1:1998

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Rules and procedures for the ass…

ISO 12085:1996/Cor 1:1998

Geometrical Product Specifications (GPS) — Surface texture: Profile method — Motif parameters — Technical Cor…