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Primary batteries - Part 2-2: Physical and electrical specifications of lithium batteries
Infrared free air applications
Fibre optic interconnecting devices and passive components - Performance standard - Part 141-2: Fibre optic passive chromatic dispersion compensator using single-mode dispersion compensating fibre for category C - Contr…
Digital addressable lighting interface - Part 252: Particular requirements - Energy reporting (device type 51)
Fixed capacitors for use in electronic equipment - Part 18-1: Blank detail specification - Fixed aluminium electrolytic surface mount capacitors with solid (MnO2) electrolyte - Assessment level EZ
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
Dependability management - Part 3-1: Application guide - Analysis techniques for dependability - Guide on methodology
Rotating electrical machines - Part 9: Noise limits
Specifications for particular types of winding wires - Part 67: Polyvinyl acetal enamelled rectangular aluminium wire, class 105
Electrical installations in ships - Part 360: Insulating and sheathing materials for shipboard and offshore units, power, control, instrumentation and telecommunication cables
Optical fibre cables - Part 1-104: Generic specification - Basic optical cable test procedures - Mechanical tests methods - Impact, method E4
Household and similar electrical appliances - Accessibility of control elements, doors, lids, drawers and handles
Audio archive system - Part 1-1: DVD disk and data migration for long-term audio data storage
Waveguide type dielectric resonators - Part 4: Sectional specification
Standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505™
Organic light emitting diode (OLED) displays - Part 2-1: Essential ratings and characteristics of OLED display modules
Semiconductor devices - Micro-electromechanical devices - Part 16: Test methods for determining residual stresses of MEMS films - Wafer curvature and cantilever beam deflection methods
Secondary cells and batteries containing alkaline or other non-acid electrolytes - Experimental procedure for the forced internal short-circuit test of IEC 62133:2012
Tests for electric cables under fire conditions - Circuit integrity - Part 31: Procedures and requirements for fire with shock - Cables of rated voltage up to and including 0,6/1 kV
High frequency inductive components - Part 1: Fixed surface mount inductors for use in electronic and telecommunication equipment