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Instrument transformers - Part 14: Additional requirements for current transformers for DC applications
Nanomanufacturing - Key control characteristics - Part 6-23: Graphene-related products - Sheet resistance, carrier density, carrier mobility: Hall bar method
High-voltage switchgear and controlgear - Part 211: Direct connection between power transformers and gas-insulated metal-enclosed switchgear for rated voltages above 52 kV
Attachment materials for electronic assembly - Part 1-3: Requirements for electronic grade solder alloys and fluxed and non-fluxed solid solder for electronic soldering applications
Surge arresters - Part 10: Rationale for tests specified by IEC 60099-4:2014
Nuclear instrumentation - Density gauges utilizing ionizing radiation - Definitions and test methods
Switches for appliances - Part 2-4: Particular requirements for independently mounted switches
Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
Noise measurement method on power capacitors
Alarm systems - Part 1: Environmental test methods
Generic specification of information on products by properties - Part 1: Principles and methods
Semiconductor devices - Semiconductor interface for automotive vehicles - Part 2: Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
Environmental conditions - Vibration and shock of electrotechnical equipment - Part 4: Equipment transported in road vehicles
Connectors for electronic equipment - Tests and measurements - Part 16-9: Mechanical tests on contacts and terminations - Test 16i: Grounding contact spring holding force
Specifications for particular types of winding wires - Part 50: Glass-fibre wound silicone resin or varnish impregnated, bare or enamelled round copper wire, temperature index 200
Photovoltaic (PV) systems - Requirements for testing, documentation and maintenance - Part 2: Grid connected systems - Maintenance of PV systems
Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Coaxial communication cables - Part 1-113: Electrical test methods - Test for attenuation constant