Overview
CEN ISO/TS 19590:2024 - "Nanotechnologies - Characterization of nano-objects using single particle inductively coupled plasma mass spectrometry (spICP‑MS)" - provides standardized guidance for reliable detection, characterization and quantification of nano‑objects in aqueous suspension using single particle ICP‑MS (spICP‑MS). The Technical Specification defines the main measurands (particle number concentration, particle mass, particle mass concentration, particle spherical‑equivalent diameter and number‑based size distribution) and also covers determination of the dissolved element mass fraction. It supersedes the earlier edition and consolidates instrument operation, calibration and reporting requirements.
Key topics and technical requirements
- Measurands defined: particle number concentration, particle mass, mass concentration, spherical equivalent diameter, number‑based size distribution, and dissolved element fraction.
- Principles of spICP‑MS: high time‑resolution acquisition (dwell time) to detect individual ion clouds from single particles; applies to quadrupole and TOF mass spectrometers (single‑ or multi‑element/isotope detection).
- Calibration approaches:
- Reference material dependent: particle frequency method, particle size method.
- Reference material free: dynamic mass flow method, microdroplet calibration method.
- Sample handling and preparation: guidance for aqueous suspensions, pastes, non‑aqueous suspensions/creams, powders and larger solids.
- Performance and QA: system qualification, quality control materials, method performance criteria, precision and measurement uncertainty considerations.
- Data treatment and reporting: minimal reporting requirements and recommended measurement parameters to ensure comparability and traceability.
Applications and users
- Environmental and water quality laboratories quantifying nanoparticle concentrations and size distributions.
- Regulatory bodies and conformity assessors validating compliance for nanomaterial safety and labeling.
- Industrial R&D and quality control in nanomaterials manufacturing (metallic and inorganic nanoparticles).
- Consumer product testing (paints, cosmetics, food contact materials) where nanoparticle content and dissolved fractions matter.
- Instrument vendors and software developers implementing spICP‑MS workflows and data analysis routines.
Practical value
- Standardizes spICP‑MS methods to improve interlaboratory comparability, traceability and reporting transparency.
- Helps laboratories choose appropriate calibration routes, assess applicability limits, and estimate measurement uncertainty.
- Enables combined particulate and dissolved elemental analysis from a single measurement stream, optimizing laboratory throughput.
Related standards
- Prepared by ISO/TC 229 and CEN/TC 352; this Technical Specification complements other ISO/CEN nanotechnology standards and guidance documents on terminology, sample preparation and reference materials within the nanotechnology standards portfolio.
Keywords: CEN ISO/TS 19590:2024, spICP‑MS, single particle inductively coupled plasma mass spectrometry, nano‑objects, particle number concentration, size distribution, dissolved element fraction.