Integrated circuits. Measurement of impulse immunity - Synchronous transient injection method
Integrated circuits. Measurement of impulse immunity - Synchronous transient injection method
What is DD IEC/TS 62215-2 - Immunity of integrated circuits about?
Integrated circuits are globally popular in most electronic devices like automobiles, watches, microwave ovens, computers, televisions, traffic lights etc. DD IEC/TS 62215-2 is a technical specification that contains general information and definitions on the test method to evaluate the immunity of integrated circuits against fast conducted synchronous transient disturbances. DD IEC/TS 62215-2 also contains a description of measurement conditions, test equipment and test set-up as well as the test procedures and the requirements on the content of the test report. The objective of DD IEC/TS 62215-2 is to describe general conditions to obtain a quantitative measure of immunity of integrated circuits establishing a uniform testing environment. DD IEC/TS 62215-2 describes the critical parameters that are expected to influence the test results. Deviations from this specification should be explicitly noted in the individual test report.
Who is DD IEC/TS 62215-2 - Immunity of integrated circuits for? BS EN DD IEC/TS 62215-2 on the immunity of integrated circuits is useful for:
Manufacturer of electronic equipment and components
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