IEC 60444-8:2003 PDF

Name: IEC 60444-8:2003 — Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
SKU: IEC 60444-8:2003
Price: 35 EUR
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Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Название (английский):

IEC 60444-8:2003

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 11
Дата публикации:: 4 июля 2003 г.
Издание:: IEC IS 60444 edition 1 version 1
ICS:: 31.140

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Описание (английский):

Explains the test fixture that allows the accurate measurement of resonance frequency, resonance resistance, and equivalent electrical circuit parameters of a leadless surface mounted quartz crystal units over the frequency range from 1 MHz to 150 MHz using zero phase technique as specified in IEC 60444-4 and IEC 60444-5.

Abstract

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Overview - IEC 60444-8:2003 (Test fixture for surface mounted quartz crystal units)

IEC 60444-8:2003 specifies the test fixture and related measurement requirements for accurate determination of resonance frequency, resonance resistance and equivalent electrical circuit parameters of leadless surface-mounted quartz crystal units (SMD quartz). The standard defines how to perform measurements using the zero phase technique (as referenced in IEC 60444-4 and IEC 60444-5) and automatic network analyzer methods over the frequency ranges allowed by the fixture and optional load capacitance.

Key topics and technical requirements

Measurement scope

Resonance frequency, resonance resistance, parallel capacitance (C0), motional capacitance (C1) and motional inductance (L1).
Measurement method: zero phase technique and admittance circle technique using an automatic network analyzer (per IEC 60444-5).

Frequency ranges

1 MHz to 150 MHz when no external load capacitance is used.
1 MHz to 30 MHz when a load capacitance is applied.

Test fixture design

Equivalent-circuit model based on IEC 60444-1; physical size/structure adapted for leadless SMD crystals.
Mechanical contact must reliably connect fixture terminals to the device electrodes; minimum contact pressure specified: 1.96 N (200 gf).
Load capacitance range: ≥ 10 pF when used.

Calibration and accuracy

Calibration requires at least three standard impedance elements: short, open (if stray capacitance significant), and a 50 Ω standard.
50 Ω standard tolerance: 50 ± 5 %, phase specified in the standard.
C-adapter board calibration uses a capacitance meter with permissible error ±0.002 pF.
Resonance resistance accuracy given as ±2 Ω or ±10 % (as stated in the document).

Mechanical and enclosure guidance

No mandatory enclosure type, but IEC 61240 SMD outline recommendations are preferred.
Overtone selection is not constrained by the fixture; measurement relies on zero phase technique.

Applications and who uses this standard

Manufacturers of SMD quartz resonators and crystal units - for production test and design verification.

Metrology and calibration laboratories - for traceable measurements of crystal parameters.

Component test engineers and quality assurance teams - to specify acceptance tests in purchase contracts.

Oscillator and frequency-control designers - to correlate measured load resonance to circuit behaviour.

Test-fixture and ATE vendors - to design compliance fixtures and calibration procedures.

Related standards

IEC 60444-1: Basic zero phase method and equivalent circuits

IEC 60444-4: Load resonance measurement method

IEC 60444-5: Automatic network analyzer methods and error correction

IEC 60444-2: Motional capacitance phase-offset method

IEC 61240: SMD outline drawings for frequency-control devices

This standard is essential when you need repeatable, high-accuracy measurements of leadless SMD quartz units using a dedicated test fixture and network-analyzer techniques.

IEC 60444-8:2003 PDF

Abstract

Похожие стандарты

Overview - IEC 60444-8:2003 (Test fixture for surface mounted quartz crystal units)

Key topics and technical requirements

Applications and who uses this standard

Related standards

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