IEC 60747-16-5:2013 PDF

Overview

IEC 60747-16-5:2013 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators defines terminology, essential ratings and characteristics, and standardized measuring methods for semiconductor microwave integrated circuit oscillators. The standard covers fixed and voltage‑controlled semiconductor microwave oscillator devices (VCOs and fixed-frequency oscillators) but excludes oscillator modules such as synthesizers that require external controllers. IEC 60747-16-5 helps manufacturers, test labs and designers specify, measure and compare oscillator performance consistently.

Key topics and technical requirements

This part of IEC 60747 sets out requirements and measurement procedures for critical oscillator parameters, including:

• Terminology and definitions to ensure consistent language across datasheets and test reports.
• Essential ratings and characteristics, such as limiting values (absolute maximum ratings), operating conditions and electrical/mechanical characteristics.
• Measuring methods and procedures for primary oscillator parameters:
  • Oscillation frequency and frequency tuning (fixed and VCO behavior)
  • Output power and output power flatness
  • Phase noise measurement (L(f))
  • Tuning sensitivity and linearity
  • Frequency pushing and frequency pulling
  • Harmonic and spurious distortion ratios
  • Modulation bandwidth and sensitivity flatness
  • Temperature coefficients for frequency and output power
• Test circuit descriptions, specified conditions and precautions to ensure reproducible, comparable results.
• Mechanical and environmental ratings relevant to packaging and reliability.

Practical applications and who uses the standard

IEC 60747-16-5 is relevant to professionals and organizations involved with RF/microwave oscillators:

• RF and microwave component designers specifying oscillator performance for wireless infrastructure, radar, satellite, test equipment and industrial/IoT systems.
• Manufacturing and quality engineers creating datasheets, production tests and acceptance criteria.
• Accredited test laboratories performing phase noise, output power and harmonic/spurious measurements.
• Procurement and compliance teams evaluating vendor claims and ensuring interoperability and reliable system integration.
• System integrators who require consistent oscillator specifications (frequency stability, phase noise, tuning behavior) for radio front ends and frequency sources.

Using this standard helps reduce ambiguity in technical specifications, enables fair comparison of parts, and supports traceable, repeatable measurement practices for semiconductor microwave oscillators.

Related standards

• Other parts of the IEC 60747 series (Semiconductor devices) and related IEC test-method standards for RF/microwave components provide complementary guidance on terminology and measurement practice. For product-specific system or module requirements, consult applicable device- or module-level standards.