IEC 60747-17:2020 PDF

Overview

IEC 60747-17:2020 - "Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation" - specifies terminology, essential ratings, safety tests and measuring methods for magnetic and capacitive couplers used to provide basic and reinforced insulation. This first edition (2020) replaces IEC PAS 60747-17:2011 and incorporates the January 2021 corrigendum. Revisions include lifetime safety factors, improved end-of-life testing and statistical lifetime methods, certification-by-similarity guidance (Annex A), and expanded surge test options.

Key topics and technical requirements

• Scope and terminology: Definitions for coupler types, insulation classes and datasheet characteristics.
• Insulation and isolation principles: Requirements for achieving protection against electrical shock using basic and reinforced insulation.
• Safety ratings and limits: Essential ratings, safety-limiting values and functional ratings to be declared on datasheets.
• Electrical safety tests: Isolation voltage tests, surge/impulse testing (including 1.2/50 µs surge pulse per IEC 61000‑4‑5 as an allowed equivalent), partial discharge measurements, and maximum surge isolation voltage requirements.
• Measuring methods: Standardized procedures for isolation capacitance (Ciso), isolation resistance (Riso), isolation tests, partial discharge measurement, switching times, and common‑mode transient immunity (CMTI).
• Lifetime and reliability: Introduction of lifetime safety factors to address aging mechanisms such as TDDB (time-dependent dielectric breakdown) in silicon dioxide and degradation of thin-film polymer isolation layers; detailed end-of-life testing and statistical lifetime interpolation methods.
• Qualification and certification: Guidance on certification by similarity (Annex A), pre-conditioning, required sample sizes and certification process.
• Practical test considerations: Use of glass transition temperature, updated pre-conditioning definitions, and alternative surge pulse shapes to improve test accessibility.

Practical applications and who uses this standard

IEC 60747-17 is essential for:

• Semiconductor manufacturers designing magnetic or capacitive isolators and opto‑replacement devices.
• Component qualification and test labs performing isolation, partial discharge and CMTI testing.
• Safety and reliability engineers assessing insulation lifetime, TDDB risks and end‑of‑life behavior.
• Product designers and system integrators in power electronics, industrial automation, medical devices and EV/charger applications that require galvanic isolation for user or system protection.
• Certification bodies reviewing conformity and applying certification-by-similarity principles.

Using IEC 60747-17 helps ensure compliant datasheet declarations, consistent test methods and robust insulation design for semiconductor couplers.

Related standards

• IEC 60747 series (semiconductor devices)
• IEC 61000-4-5 (surge testing referenced for 1.2/50 µs pulse)