IEC 60747-5-18:2026 PDF

Name: IEC 60747-5-18:2026 — Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
SKU: IEC 60747-5-18:2026
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Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

Название (английский):

IEC 60747-5-18:2026

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 17
Дата публикации:: 11 июня 2026 г.
Издание:: IEC IS 60747 edition 1 version 1
ICS:: 31.080.99

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Описание (английский):

IEC 60747-5-18:2026 specifies the measuring methods of macro photoluminescence (PL) for red, green, and blue epitaxial wafers of micro light emitting diodes (LEDs) prior to chip fabrication processes. Wafer sizes being considered are 4 in, 6 in, and 8 in in diameter.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

IEC 60747-5-18:2026 defines standardized test methods for measuring macro photoluminescence (PL) characteristics in red, green, and blue epitaxial wafers of micro light emitting diodes (micro LEDs) before chip fabrication. Developed by the International Electrotechnical Commission (IEC), this standard applies to wafer sizes of 4 in, 6 in, and 8 in diameter. By establishing reliable procedures and measurement setups, this document supports enhanced quality control and consistent performance for advanced optoelectronic devices.

Key Topics

Macro Photoluminescence (PL):

Involves assessing the optical properties of LED wafer materials by analyzing the emitted light under optical excitation.
Measurements focus on parameters such as peak PL signal, peak and centroid wavelengths, full width at half maximum (FWHM), and integrated PL signal.
Test results provide critical insight into wafer uniformity and LED material quality before mass processing.

Measurement Methods:

Specifies measuring conditions including ambient temperature (25 ± 3 °C) and relative humidity (25%–75% RH).
Details the use of equipment such as lasers, spectrometers, convex lenses, long-wavelength-pass filters, and precision motion-controlled stages.
Outlines systematic scanning procedures to map PL characteristics across the entire wafer, including edge exclusion zones.

Test Reporting:

Requires detailed documentation of wafer size, measurement setup, scanning methods, PL results, and environmental conditions.
Standardizes data formats for consistent reporting and easier comparison among manufacturers and research entities.

Applications

Adherence to IEC 60747-5-18:2026 brings several practical benefits to the semiconductor and optoelectronics industry:

Quality Assurance:

Reliable and reproducible photoluminescence testing helps screen out defective or non-uniform epitaxial wafers, improving yield and reducing costly downstream failures.

Process Optimization:

Standardized measurement results support benchmarking and process tuning for manufacturers seeking to optimize epitaxial growth and post-growth handling.

R&D and Materials Selection:

Laboratories and development teams use macro PL test data to evaluate new materials or wafer designs, accelerating innovation in micro LED technology.

Supply Chain Consistency:

Common methods and reporting requirements facilitate transparent communication between wafer suppliers and LED component manufacturers.

Regulatory and Certification Support:

Compliance with IEC standards demonstrates commitment to industry best practices and may be required for access to certain global markets.

Related Standards

Organizations engaged in micro LED development or production may also reference these related international standards for a robust quality management approach:

IEC 60747 series – General requirements for semiconductor devices and optoelectronic components.

CIE 250:2022 – Guidance on spectroradiometric measurement of optical radiation sources, relevant for spectral PL analysis.

IEC 60050-731:1991 – International Electrotechnical Vocabulary for optical communication concepts.

IEC 60747-5-8:2019 – Additional details on photoluminescence and related optoelectronic test methods.

Implementing IEC 60747-5-18:2026 ensures accurate, repeatable testing and promotes international harmonization in the rapidly evolving micro LED sector. This facilitates high-quality device fabrication, product reliability, and market competitiveness.

IEC 60747-5-18:2026 PDF

Abstract

Похожие стандарты

Overview

Key Topics

Applications

Related Standards

Технические детали

IEC 60747-5-8:2019

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