IEC 60748-4-3:2006 PDF
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 36
- Дата публикации:
- 29 августа 2006 г.
- Издание:
- IEC IS 60748 edition 1 version 1
- ICS:
- 31.200
Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics
Abstract
Overview
IEC 60748-4-3:2006 - "Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)" specifies measuring methods, terminology and requirements for testing ADCs under . The standard defines how to obtain time-domain output records from ADCs, convert them to the frequency domain (FFT) and quantify dynamic performance including distortion, noise and spurious outputs. It covers both single-frequency (sinusoidal) and test methods and explains relevant terms such as , , and .
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