IEC 60749-1:2002 PDF
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 15
- Дата публикации:
- 30 августа 2002 г.
- Издание:
- IEC IS 60749 edition 1 version 1
- ICS:
- 31.080.01
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
Abstract
Overview
IEC 60749-1:2002 is an international standard published by the International Electrotechnical Commission (IEC) focusing on . This standard provides the for mechanical and climatic test methods applicable to semiconductor devices, including both . As Part 1 of the series, it lays the foundational framework applicable across all individual test methods covered in subsequent parts of the series. The standard includes updates from the August 2003 corrigendum to maintain alignment with current industry practices.
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