IEC 60749-11:2002 PDF

Name: IEC 60749-11:2002 — Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
SKU: IEC 60749-11:2002
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Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Название (английский):

IEC 60749-11:2002

Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 13
Дата публикации:: 12 апреля 2002 г.
Издание:: IEC IS 60749 edition 1 version 1
ICS:: 31.080.01

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Описание (английский):

Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that are used for the purpose of cleaning devices. This test is applicable to all semiconductor devices. It is considered destructive unless otherwise detailed in the relevant specification. The contents of the corrigenda of January 2003 and August 2003 have been included in this copy.

Abstract

Похожие стандарты

Упомянутые в описании и другие стандарты IEC

Overview

IEC 60749-11:2002 is an international standard developed by the International Electrotechnical Commission (IEC) that specifies the test method for rapid change of temperature on semiconductor devices using the two-fluid-bath method. This standard focuses on evaluating the resistance of semiconductor devices to sudden exposure to extreme temperature variations, simulating conditions devices might encounter during use or cleaning. As a mechanical and climatic test, it is essential to assess the reliability and robustness of semiconductor components under thermal stress.

The standard applies to all semiconductor devices and is generally considered destructive unless otherwise specified in the device's technical documentation. It complements other test procedures by offering a means to simulate rapid temperature cycling through controlled immersion in two fluid baths at different temperatures.

Key Topics

Rapid Change of Temperature Test This method exposes semiconductor devices to sudden transfers between baths of differing temperatures. It simulates rapid temperature transients that may cause mechanical or material stress.

Two-Fluid-Bath Method The two-fluid-bath technique involves immersing the device sequentially in two heated liquids at different temperatures to achieve rapid thermal cycling. This method is effective for assessing device integrity under abrupt temperature shifts.

Test Parameters and Terms

Load: The collection of devices under test and their fixtures placed in the bath.
Monitoring Sensor: Calibrated temperature sensor to ensure accurate temperature control at the worst-case location in the device load.
Transfer Time: Time elapsed between withdrawing the load from the first bath and immersion into the second.
Maximum Load: The heaviest specimen mass for which temperature and timing conditions are maintained adequately.

Test Conditions The test typically runs for 15 cycles under specified temperature and immersion durations, although fewer cycles may be used to simulate effects such as cleaning operations involving immersion in hot liquids (typically 5 to 10 cycles).

Applicability and Scope This method is suitable for all types of semiconductor devices to assess their ability to withstand thermal shocks. It also aligns with IEC 60068-2-14 but incorporates semiconductor-specific requirements.

Applications

Device Reliability Testing Semiconductor manufacturers use this test during product qualification to verify devices can resist thermal shock and rapid temperature variation without failure.

Cleaning Process Validation By applying fewer thermal cycles, the two-fluid-bath method also tests the effects of immersion in heated cleaning liquids, ensuring cleaning processes do not mechanically or thermally damage the devices.

Quality Assurance Programs Integrating this standard in quality control helps identify potential weaknesses before product deployment, minimizing field failures due to temperature-related stress.

Research and Development Device designers utilize this methodology during material and package development to optimize thermal robustness and longevity.

Related Standards

IEC 60749-3: Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual methods Provides complementary procedures such as visual inspection after mechanical and climatic testing.

IEC 60068-2-14: Environmental testing – Part 2: Tests – Test N: Change of temperature A related environmental test standard for temperature cycling in air to air conditions which takes precedence in device qualification when both methods are applied.

ISO/IEC Directives Part 3 Governs the preparation and drafting of IEC standards ensuring consistency and quality of documentation.

Conclusion

IEC 60749-11:2002 is a critical standard for the semiconductor industry, enabling standardized testing of rapid temperature changes using the two-fluid-bath method. By providing a reliable means to evaluate the thermal shock resistance of devices, this standard ensures component durability, optimizes cleaning processes, and supports overall quality assurance. Adherence to this international standard helps stakeholders maintain high reliability and performance under challenging environmental conditions.

IEC 60749-11:2002 PDF

Abstract

Похожие стандарты

Overview

Key Topics

Applications

Related Standards

Conclusion

Технические детали

IEC 60068-2-14:2009

Environmental testing - Part 2-14: Tests - Test N: Change of temperature

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