IEC 60749-17:2003 PDF
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 11
- Дата публикации:
- 20 февраля 2003 г.
- Издание:
- IEC IS 60749 edition 1 version 1
- ICS:
- 31.080.01
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Abstract
Overview
IEC 60749-17:2003 is an international standard issued by the International Electrotechnical Commission (IEC) that defines mechanical and climatic test methods for semiconductor devices, focusing specifically on neutron irradiation. This standard applies to integrated circuits and discrete semiconductor devices, providing guidelines to assess their susceptibility to degradation when exposed to neutron radiation. Primarily intended for military and space applications, the test described is destructive and critical for ensuring device reliability in harsh neutron environments.
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