IEC 61169-1-5:2022 PDF
Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation
Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 24
- Дата публикации:
- 3 февраля 2022 г.
- Издание:
- IEC IS 61169 edition 1 version 1
- ICS:
- 33.120.10
IEC 61169-1-5:2022 provides test methods for the rise time degradation of radio frequency (RF) connector. This document is applicable to triaxial and other radio frequency connectors.
Abstract
Overview
IEC 61169-1-5:2022 is an international standard published by the International Electrotechnical Commission (IEC) that defines electrical test methods for measuring rise time degradation in radio frequency (RF) connectors. Specifically, it provides a standardized process to assess how RF connectors, including triaxial and other types, affect the rise time of transient voltage signals passing through them. This standard is vital for ensuring the performance and reliability of RF connectors used in a wide range of electronic and communication systems.
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