Overview
IEC 61671-2:2016 / IEEE Std 1671.2-2012 specifies an exchange format, based on Extensible Markup Language (XML), for describing test and measurement instruments used in automatic test systems (ATS). The standard defines both the static model description (InstrumentDescription) and the concrete instrument instance information (InstrumentInstance), expressed as XML schemas. It is published as an IEC/IEEE dual-logo standard and forms part of the Automatic Test Markup Language (ATML) family.
Key topics and technical requirements
- XML schema-based exchange format: Formal XML schemas for InstrumentDescription and InstrumentInstance to standardize how instruments are represented and exchanged.
- Schema structure: Definitions cover schema elements, child elements, complex types and simple types to capture instrument attributes and capabilities.
- Instance vs. model: Separation of reusable instrument model descriptions (static) from specific instance data (serial numbers, configuration).
- Extensibility: Mechanisms to extend ATML InstrumentDescription schemas to accommodate vendor-specific or domain-specific attributes.
- Conformance and validation: Rules for conformance, schema locations and validation to ensure interoperability between tools and systems.
- Supporting material: Informative annexes, downloadable template instance documents and examples (including legacy synthetic-instrument templates) to guide implementation.
- Terminology and references: Glossary and normative references to align definitions and usage across the ATML framework.
Practical applications
IEC 61671-2 is designed to enable consistent machine-readable documentation and integration of instrumentation across automated test environments:
- Integrating instruments (PXI, VXI, LXI, USB, etc.) into automatic test equipment (ATE) and ATS configuration tools.
- Exchanging instrument capability and configuration data between instrument vendors, system integrators, and test software.
- Automating test-bed discovery, resource allocation and diagnostics by reading InstrumentInstance documents.
- Documenting synthetic instruments and vendor-supplied instrument templates for rapid system upgrade or lifecycle management.
- Supporting test data management, calibration tracking and logistics by linking instance metadata to enterprise systems.
Who should use this standard
- Test system integrators and ATE/ATS designers
- Instrument vendors providing machine-readable device descriptions
- Test software and middleware developers (test sequencers, resource managers)
- Maintenance, calibration and logistics teams requiring standardized device metadata
- Defense, aerospace, automotive and electronics manufacturers with automated test needs
Related standards
- IEEE Std 1671.2-2012 (same technical content)
- Other ATML component standards (part of the ATML framework)
- Referenced normative IEC/IEEE documents and downloadable template materials (see annexes and schema locations in the standard)
Keywords: IEC 61671-2, IEEE 1671.2, ATML, InstrumentDescription, InstrumentInstance, XML schema, automatic test system, ATE, instrument description, synthetic instrument.