IEC 62047-20:2014 PDF

Name: IEC 62047-20:2014 — Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
SKU: IEC 62047-20:2014
Price: 35 EUR
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Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes

Название (английский):

IEC 62047-20:2014

Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 108
Дата публикации:: 26 июня 2014 г.
Издание:: IEC IS 62047 edition 1 version 1
ICS:: 31.080.99

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Язык документа:

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Срок поставки:18 раб. дн. (перевод)

Цена:1 620 €

Описание (английский):

IEC 62047-20:2014 specifies terms and definitions, ratings and characteristics, and measuring methods of gyroscopes. Gyroscopes are primarily used for consumer, general industries and aerospace applications. MEMS and semiconductor lasers are widely used for device technology of gyroscopes.

Abstract

Overview

Key Topics

Terms and Definitions: Standardized vocabulary for gyroscopes within semiconductor and MEMS technology contexts, supporting clarity and communication across industries.
Categories of Gyroscopes: Classification schemes that organize gyroscopes based on function and application, aiding in product selection and specification.
Ratings and Characteristics: Defines absolute maximum ratings, normal operating conditions, key device characteristics such as sensitivity, bias, noise, frequency response, and resolution essential for device performance evaluation.
Measuring Methods: Detailed measurement procedures and circuits designed to precisely assess critical performance parameters, including:
- Scale factor measurement and calibration processes.
- Cross-axis sensitivity testing to determine device robustness against off-axis inputs.
- Bias measurement and stability analysis.
- Output noise characterization for signal integrity.
- Frequency band and response calibration.
- Resolution assessment to evaluate smallest detectable angular velocity.
Specified Conditions: Establishes uniform testing environments and procedures for consistency and repeatability in measurement results.

Applications

IEC 62047-20:2014 gyroscope standards apply extensively in fields requiring accurate angular motion sensing, including:

Consumer Electronics: Smartphones, gaming controllers, wearable devices, and navigation systems utilize MEMS gyroscopes for orientation detection and motion tracking.
Industrial Automation: Robotics, machinery monitoring, and vehicle stability control systems benefit from standard-compliant gyroscopes ensuring reliable performance in critical environments.
Aerospace and Defense: Flight control, inertial navigation, and guidance systems demand high-precision gyroscopes that conform to rigorous testing standards for safety and reliability.
Automotive Systems: Advanced driver-assistance systems (ADAS), stability control, and autonomous vehicle sensors incorporate MEMS gyroscopes adhering to defined performance metrics.
Medical Devices: Surgical tools and patient monitoring systems using inertial sensing gain reliability and accuracy through compliance with IEC gyroscope standards.

By following IEC 62047-20:2014, manufacturers and developers ensure product quality, interoperability, and compliance with global requirements, thereby supporting technological innovation and safety across diverse industries.

Related Standards

IEC 62047 Series: Covers micro-electromechanical systems (MEMS) devices broadly, complementing the gyroscope-specific part 20 standard.
IEC 60747 Series: Addresses semiconductor devices generally, providing foundational concepts related to device-level specifications and testing.
ISO/IEC 16063: Relates to vibration and shock sensor calibration, relevant for MEMS sensors including gyroscopes.
IEEE Standards on MEMS Sensors: Provide complementary guidelines on testing and performance for MEMS-based sensing devices.
ISO 14252: Specifies inertial sensor testing methods often used alongside IEC standards for gyroscope evaluation.

Utilizing IEC 62047-20:2014 in conjunction with these standards ensures comprehensive coverage for semiconductor MEMS gyroscope design, testing, and application.

Keywords: IEC 62047-20:2014, MEMS gyroscopes, semiconductor devices, gyroscope standards, micro-electromechanical systems, gyro measurement methods, gyroscope ratings, bias stability, scale factor calibration, cross-axis sensitivity, aerospace gyroscopes, consumer electronics sensors, industrial automation sensors.

Технические детали

Технический комитет: SC 47F - Micro-electromechanical systems
SKU: IEC 62047-20:2014

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