IEC 62047-33:2019 PDF

Name: IEC 62047-33:2019 — Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device
SKU: IEC 62047-33:2019
Price: 35 EUR
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Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device

Название (английский):

IEC 62047-33:2019

Semiconductor devices - Micro-electromechanical devices - Part 33: MEMS piezoresistive pressure-sensitive device

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 24
Дата публикации:: 5 апреля 2019 г.
Издание:: IEC IS 62047 edition 1 version 1
ICS:: 31.080.99

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Описание (английский):

IEC 62047-33:2019 (E) defines terms, definitions, essential ratings and characteristics, as well as test methods applicable to MEMS piezoresistive pressure-sensitive device. This document applies to piezoresistive pressure-sensitive devices for automotive, medical treatment, electronic products.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

IEC 62047-33:2019 - "Semiconductor devices - Micro‑electromechanical devices - Part 33: MEMS piezoresistive pressure‑sensitive device" - specifies terms, essential ratings and characteristics, and test methods applicable to MEMS piezoresistive pressure‑sensitive devices. The standard targets devices that convert pressure into electrical signals via the piezoresistive effect (typically a cavity‑membrane silicon structure with an integrated Wheatstone bridge). It applies to pressure sensors used in automotive, medical treatment, and other electronic products.

Key Topics

The standard defines or requires:

Terms and definitions specific to MEMS piezoresistive pressure sensors (aligned with IEC 60747‑14‑3).

Essential ratings and characteristics:

Limiting values (ratings), recommended operating conditions, and device characteristics.
A summary table of device characteristics as a reference.

Comprehensive test methods, covering electrical, static, dynamic and environmental performance:

Electrical tests: input/output resistance, leakage current, breakdown and isolation voltages.
Static performance: zero output, full‑span output, sensitivity, nonlinearity, hysteresis, repeatability, accuracy, zero drift.
Stability and long‑term tests: zero and sensitivity stability.
Temperature influence: thermal zero drift, thermal sensitivity drift and thermal hysteresis.
Dynamic performance: frequency response, resonant/ ringing frequency, damping ratio, rise time and overshoot.
Environmental tests: high/low temperature storage, temperature cycling, vibration, mechanical shock, acceleration, moisture (HAST), mould growth, salt atmosphere, EMC and pressure extremes.

Test setups and figures: example circuit connections for P‑N isolation and insulating medium devices, and recommended test system diagrams.

Applications and Who Uses It

IEC 62047‑33:2019 is practical for:

MEMS pressure sensor manufacturers - for product specification, design verification and QA.

Test laboratories and device integrators - to perform standardized electrical, mechanical and environmental qualification.

Automotive and medical device developers - to select sensors meeting required stability, accuracy and environmental robustness.

Procurement and regulatory teams - to define conformance criteria for supplier evaluation.

Keywords: MEMS piezoresistive pressure‑sensitive device, IEC 62047‑33:2019, pressure sensor test methods, piezoresistive sensor ratings, sensor stability, automotive pressure sensors, medical pressure sensors.

IEC 62047-33:2019 PDF

Abstract

Похожие стандарты

Overview

Key Topics

Applications and Who Uses It

Related Standards

Технические детали

BS IEC 60747-14-3:2009

Semiconductor devices - Semiconductor sensors. Pressure sensors

IEC 60068-2-82:2007/COR1:2009

Corrigendum 1 - Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and…

IEC 60749-2:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure