IEC 62132-4:2006 PDF

Name: IEC 62132-4:2006 — Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
SKU: IEC 62132-4:2006
Price: 35 EUR
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Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

Название (английский):

IEC 62132-4:2006

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 49
Дата публикации:: 21 февраля 2006 г.
Издание:: IEC IS 62132 edition 1 version 1
ICS:: 31.200

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Описание (английский):

Describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method guarantees a high degree of repeatability and correlation of immunity measurements. This standard establishes a common base for the evaluation of semiconductor devices used in equipment functioning in an environment subject to unwanted radio frequency electromagnetic waves.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

IEC 62132-4:2006 is an international standard developed by the International Electrotechnical Commission (IEC) that defines a method for assessing the electromagnetic immunity of integrated circuits (ICs) within the frequency range of 150 kHz to 1 GHz. Specifically, it details the Direct RF Power Injection (DPI) method for evaluating how ICs respond to conducted radio-frequency (RF) disturbances, such as those that originate from radiated RF emissions picked up by system cables or circuit board traces.

By providing a consistent and reproducible testing procedure, IEC 62132-4:2006 helps engineers and manufacturers accurately measure and compare the resilience of semiconductor devices against unwanted electromagnetic energy in real-world environments. This standard is a vital part of the broader IEC 62132 series, which collectively addresses the immunity measurements of ICs.

Key Topics

Direct RF Power Injection Method: This core technique involves injecting RF power directly into the pins of an IC through a carefully controlled test setup, rather than relying on field-based (radiated) immunity testing. This approach achieves a high degree of repeatability and allows precise measurement of the IC’s susceptibility to conducted RF disturbances.

Testing Configuration: The DPI method uses a robust test arrangement featuring:

An RF signal generator and amplifier to produce and control the disturbance signal.
Directional couplers and RF power meters to accurately measure injected and reflected power.
Decoupling networks and PCB layouts designed to minimize resonances and ensure reliable results.

Repeatability and Correlation: By standardizing test conditions and procedures, IEC 62132-4:2006 enables repeatable immunity measurements across different labs and manufacturers, supporting clear comparison of device performance.

Performance Characterization: Immunity levels determined by this method correspond to the forward power required to cause a defined malfunction in the IC, classified according to performance criteria established in IEC 62132-1.

Applications

IEC 62132-4:2006 is highly relevant for:

Semiconductor Design and Validation: Chip manufacturers and PCB designers use the DPI method to validate the RF immunity of ICs used in sensitive and high-reliability applications such as automotive electronics, industrial control systems, and consumer devices.

Electromagnetic Compatibility (EMC) Testing: Ensures that ICs meet EMC requirements by quantifying their tolerance to conducted RF energy, thereby reducing the risk of malfunctions in environments with high levels of electromagnetic interference.

Quality Assurance and Regulatory Compliance: Testing ICs per this standard can support compliance with global EMC directives and facilitate market approvals by demonstrating robust immunity performance.

System Integration: By understanding IC immunity, system integrators can choose appropriate components and implement effective PCB and system-level shielding and filtering strategies.

Related Standards

IEC 62132-4:2006 is part of the IEC 62132 series, which covers various aspects of electromagnetic immunity testing for integrated circuits. Related standards include:

IEC 62132-1: General conditions and definitions for measuring the immunity of ICs.

IEC 62132-2: (G-)TEM cell method for immunity measurements.

IEC 62132-3: Bulk current injection (BCI) method for IC immunity testing.

IEC 62132-5: Workbench Faraday cage method.

IEC 61967-4: Addresses measurement of electromagnetic emissions from ICs using direct coupling methods.

IEC 61000-4-6: EMC standard for immunity to conducted RF disturbances for electronic systems.

Practical Value

Implementing IEC 62132-4:2006 helps manufacturers and designers:

Benchmark immunity performance of semiconductor devices under standardized test conditions.

Identify potential failure modes early in the design process, reducing costly redesigns.

Enhance system reliability in environments with prevalent electromagnetic interference.

Facilitate global market access by supporting declarations of conformity to relevant EMC standards.

By adhering to IEC 62132-4:2006, industry stakeholders can ensure that integrated circuits meet essential electromagnetic immunity requirements, contributing to the overall robustness and reliability of modern electronic systems.

IEC 62132-4:2006 PDF

Abstract

Похожие стандарты

Overview

Key Topics

Applications

Related Standards

Practical Value

Технические детали

IEC 62132-5:2005

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday c…

IEC 62132-1:2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

IEC 62132-2:2010

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TE…

IEC 62132-3:2007

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current inject…

IEC 61967-4:2002/COR1:2017

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Me…

IEC 61000-4-6:2013/COR1:2015

Corrigendum 1 - Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity…