Overview
IEC 62228-3:2019 is an international standard developed by the International Electrotechnical Commission (IEC) that focuses on the electromagnetic compatibility (EMC) evaluation of Controller Area Network (CAN) transceiver integrated circuits (ICs). It provides comprehensive test and measurement methods under real network conditions, ensuring CAN transceivers meet stringent EMC requirements. This standard applies to traditional CAN transceivers, those with partial networking functionality, and transceivers supporting flexible data rate capabilities.
As the third part in the IEC 62228 series, this edition replaces and updates the 2007 IEC TS 62228 first edition. Key improvements include updates to test configurations, failure criteria, and test procedures-particularly incorporating evolving CAN technology such as partial networking and flexible data rate operation.
Key Topics
IEC 62228-3:2019 covers essential EMC parameters and defines rigorous test methodologies to validate CAN transceiver performance in operational environments:
- Emission of RF Disturbances: Measurement of radio frequency emissions produced by the IC to prevent interference with other devices.
- Immunity to RF Disturbances: Tests that assess transceiver resilience against external radio frequency noise under network conditions.
- Immunity to Impulses: Evaluates resistance to transient electrical disturbances such as voltage spikes.
- Immunity to Electrostatic Discharges (ESD): Critical evaluation of VCIC's tolerance to electrostatic events, including unpowered states.
The standard specifies detailed test configurations, including test boards and network setups, with minimal communication networks of two transceivers to replicate real-world CAN environments. It defines operational modes and appropriate test signals tailored to verify functional behavior during EMC stress, including wake-up from low power mode.
Annexes provide additional resources:
- Annex C offers example test limits focused on automotive applications.
- Annex D details characterization methods for common mode chokes (CMC) used in CAN bus interfaces, including leakage inductance and saturation tests.
Applications
IEC 62228-3:2019 is essential for semiconductor manufacturers, automotive OEMs, and testing laboratories involved in the design, evaluation, and certification of CAN transceiver ICs. Practical applications include:
- Automotive Electronics: Ensuring CAN transceivers meet EMC standards critical for safety and reliability in vehicle communication networks.
- Industrial Automation: Validating transceivers used in factory automation and control systems where noise immunity is paramount.
- Communication Devices: Certifying ICs in devices that rely on CAN communication to sustain operation in electrically noisy environments.
- Quality Assurance Testing: Providing a standardized framework for EMC testing and reporting to facilitate compliance with international regulations.
By following IEC 62228-3, manufacturers can reduce EMC-related failures, improve interoperability, and enhance product robustness.
Related Standards
To ensure a holistic EMC strategy for integrated circuits and networking devices, the following related IEC and international standards may be referenced alongside IEC 62228-3:
- IEC 62228-1 & IEC 62228-2: These parts focus on EMC evaluation of LIN and FlexRay transceivers respectively.
- ISO 10605: Road vehicles - Test methods for ESD immunity which complement ESD testing in this standard.
- ISO 11898-2 & ISO 11898-3: Standards defining the CAN physical and data link layers, crucial for understanding functional communication requirements.
- IEC 61000 series: Broader EMC standards covering environmental testing and immunity.
Incorporating IEC 62228-3:2019 ensures a comprehensive approach addressing both EMC performance and operational integrity of CAN transceivers within complex electronic systems.
Keywords: IEC 62228-3:2019, CAN transceivers, EMC evaluation, electromagnetic compatibility, RF disturbances, electrostatic discharge (ESD), automotive electronics, integrated circuits, partial networking, flexible data rate, test procedures, common mode choke, emission immunity.