Overview
IEC 62433-2:2017 is an international standard published by the International Electrotechnical Commission (IEC) that focuses on electromagnetic compatibility (EMC) integrated circuit (IC) modelling. Specifically, this part addresses models of integrated circuits for electromagnetic interference (EMI) behavioural simulation, with a primary emphasis on conducted emissions modelling. The standard introduces and specifies the Integrated Circuit Emission Model - Conducted Emission (ICEM-CE), a macro-model framework that enables accurate simulation of conducted electromagnetic emissions originating from ICs on printed circuit boards (PCBs).
This edition of the standard incorporates a significant update: the addition of an XML-based exchange format, enhancing model representation, interoperability, and automated processing in simulation workflows. IEC 62433-2:2017 applies to a wide variety of IC types including digital, analog, IC-dies, functional blocks, and Intellectual Property (IP) blocks, making it essential for EMC engineers, circuit designers, and simulation tool developers working in emissions reduction and compliance.
Key Topics
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ICEM-CE Macro-Model Structure: Details general macro-model configurations including block-based and sub-model-based approaches that replicate internal activities (IA), passive distribution networks (PDN), and inter-block coupling (IBC) within ICs.
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Conducted Emission Simulation: Provides methodologies to simulate conducted emissions stemming from both the core digital activities and I/O activities of integrated circuits, enabling early detection and mitigation of EMI issues.
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Parameter Extraction Requirements: Defines guidelines and constraints for extracting ICEM-CE parameters including environment assumptions, IA, PDN, and IBC characteristics to ensure accurate behavioural representation.
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XML Exchange Format (CEML): Introduces the Conducted Emissions Modelling Language (CEML)-an XML-based hierarchical format for exchanging the macro-model data. CEML standardizes headers, lead definitions, SPICE macro-models, and validity information to support interoperability between tools and organizations.
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Model Components and Keywords: Specifies detailed keywords and attribute definitions used in CEML for describing PDNs, IBCs, and IA components, enhancing clarity and uniformity across IC emission simulation models.
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Example Implementations: The standard includes informative annexes showcasing example models and parameter generation techniques to aid practitioners in creating and validating their own ICEM-CE macro-models.
Applications
IEC 62433-2:2017 is vital for professionals and organizations involved in:
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EMC Design and Compliance: Supporting engineers to predict and mitigate conducted EMI at the IC design stage, reducing costly post-production fixes for EMC compliance.
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PCB and System-Level EMI Simulation: Integrating IC emission macro-models within system-level simulation tools to analyze conducted emissions along PCB traces and external interfaces.
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IC Product Development: Enabling semiconductor manufacturers to characterize IC emission behaviour more accurately during product validation phases, improving design robustness.
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IP Block Development and Verification: Assisting IP core developers to simulate emission sources internally, facilitating more comprehensive EMI control strategies.
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Simulation Tool Development: Providing a structured, standardized approach to implement IC emission models into EDA and EMI behavioural simulation software.
Related Standards
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IEC 62433-1: General EMC IC modelling principles and terminology supporting the series.
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IEC 61000 Series: Electromagnetic compatibility standards addressing system-level EMC requirements.
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CISPR Standards: Covering limits and measurements for conducted and radiated emissions applicable at the device and system level.
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SPICE Modelling Standards: Providing analog and digital circuit simulation definitions used within the macro-models.
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IEC 62433-3: (If published) Potential subsequent parts addressing additional EMI emission modelling aspects or radiated emission simulations.
By adhering to IEC 62433-2:2017, designers and engineers can achieve enhanced accuracy in EMI behavioural simulations, improve the predictability of conducted emissions, and facilitate standardized model exchange through the XML-based CEML format. This helps ensure that integrated circuits meet stringent EMC requirements, ultimately supporting safe, reliable, and compliant electronic systems.