IEC 62527:2007 PDF

Name: IEC 62527:2007 — Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
SKU: IEC 62527:2007
Price: 35 EUR
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Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

Название (английский):

IEC 62527:2007

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 39
Дата публикации:: 7 ноября 2007 г.
Издание:: IEEE IS 62527 edition 1 version 1
ICS:: 25.040.01

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Описание (английский):

STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Abstract

Похожие стандарты

Упомянутые в описании и другие стандарты IEC

Overview - IEC 62527:2007 (STIL DC Level Specification)

IEC 62527:2007 (also published as IEEE Std 1450.2-2002) is an international standard that extends the Standard Test Interface Language (STIL) to specify DC level conditions for automated test equipment (ATE). It defines STIL language constructs that express the DC bias and voltage/current conditions required to execute digital vectors on a device under test (DUT). The extension enables consistent, machine-readable DC specifications that accompany vector-based functional and parametric tests.

Key topics and technical requirements

STIL language extensions for DC: Adds constructs to STIL for declaring DC conditions that are applied during test execution.

Scope of specification: Allows DC conditions to be applied globally, by pattern burst, by pattern, or by vector, giving fine-grained control over test-level DC settings.

Alternate DC levels: Supports definition of multiple, named DC levels (alternate levels) so tests can switch between bias points as required.

Level selection during periods: Provides mechanisms to select primary or alternate DC levels within a time period (similar to timed format events), enabling time-sequenced DC changes during vector sequences.

DCSequence and related blocks: Document includes blocks (for example, DCSequence) to organize and sequence DC conditions within STIL (see table of contents in the standard).

Interoperability with ATE: Language constructs are designed so ATE vendors and test program developers can interpret and implement the DC requirements consistently.

Applications and who uses it

Test engineers and test program developers use IEC 62527 to embed precise DC bias and voltage/current requirements in STIL test descriptions, ensuring correct test execution on ATE.

ATE manufacturers and tool vendors implement parsers and executors that honor STIL DC constructs to reproduce intended DC conditions on test systems.

IC designers and production teams use the standard to document repeatable DC conditions for functional vector tests, power-up sequences, and mixed-signal checks.

Useful in wafer sort, final test, and system-level verification where vector timing and DC conditions must be coordinated.

Benefits

Portable test definitions: Embeds DC requirements in STIL for consistent cross-platform test execution.

Reproducibility: Reduces ambiguity about biasing and alternate levels during vector tests.

Integration: Aligns DC control with existing STIL timing and vector structures, simplifying test program generation.

Related standards

IEEE Std 1450-1999 (STIL) - base Standard Test Interface Language.

IEEE 1450.2-2002 / IEC 62527:2007 - the dual-logo publication extending STIL for DC level specification.

Keywords: IEC 62527, STIL, Standard Test Interface Language, DC level specification, ATE, automated test equipment, digital vectors, DC conditions, device under test (DUT).

IEC 62527:2007 PDF

Abstract

Похожие стандарты

Overview - IEC 62527:2007 (STIL DC Level Specification)

Key topics and technical requirements

Applications and who uses it

Benefits

Related standards

Технические детали

BS IEC 62527:2007

Standard for extensions to standard test interface language (STIL) for DC level specification

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