IEC 62528:2007 PDF
Standard Testability Method for Embedded Core-based Integrated Circuits
Standard Testability Method for Embedded Core-based Integrated Circuits
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 125
- Дата публикации:
- 7 ноября 2007 г.
- Издание:
- IEEE IS 62528 edition 1 version 1
- ICS:
- 01
Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.
Abstract
Overview
IEC 62528:2007 (IEEE 1500-2005) - - defines a standardized hardware architecture and test protocol for testing embedded IP cores inside a System on Chip (SoC). The standard specifies a scalable wrapper-based approach and leverages the to enable communication between core designers and integrators. Published as an IEC/IEEE dual-logo standard, provides rules and compliance levels for integrating testability into embedded core designs.
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