IEC 62884-2:2017 PDF

Overview

IEC 62884-2:2017 - Measurement techniques of piezoelectric, dielectric and electrostatic oscillators: Part 2: Phase jitter measurement method - defines standard methods to measure and evaluate phase jitter of oscillators (including crystal, dielectric resonator oscillators (DROs) and FBAR-based oscillators). The standard prescribes using phase noise measurement equipment or a phase-noise measurement system and gives guidance to obtain accurate RMS jitter values and other jitter metrics.

Key topics

• Scope and targets
  • Measurement procedures specifically for piezoelectric, dielectric and electrostatic oscillators, with guidance for DROs and thin-film bulk acoustic resonator (FBAR) oscillators.
• Measurement domains
  • Procedures for measuring phase jitter in the time domain, data domain, and frequency domain (phase-noise-based methods).
• Equipment and setup
  • Use of phase noise analyzers, sampling oscilloscopes, and jitter/wander analysers (e.g., block diagrams referenced to ITU-T practices).
  • Requirements on input/output impedances, output waveform, output voltage, and jitter floor of measurement systems.
• Test procedures and environment
  • Pre-test setup and configuration, measurement under reference temperature, temperature-characteristics testing, measurement under vibration, impact, and accelerated ageing.
• Calculation and analysis
  • Normative Annex A: calculation methods linking phase noise (SSB phase noise) to phase jitter metrics - RMS jitter, peak-to-peak, random vs deterministic jitter, and total jitter.
• Measurement integrity
  • Guidance on test fixtures, cables, instruments, error sources, and factors affecting measurement uncertainty.
• Document structure
  • Normative references and terminology aligned with related IEC and ISO vocabularies.

Applications

IEC 62884-2:2017 is useful for:

• Oscillator manufacturers validating phase jitter performance for product datasheets and customer delivery.
• Test laboratories standardizing measurement procedures and reporting reproducible RMS jitter and phase-noise-derived metrics.
• RF and system engineers designing communications, satellite, automotive, EV control and timing systems where low jitter/phase noise is critical.
• Quality and compliance teams performing environmental and ageing tests (temperature, vibration, impact, accelerated ageing) to assess long-term oscillator stability.

Related standards

• IEC 62884-1:2017 - Basic measurement methods for oscillators
• IEC 60679-1:2017 - Generic specifications for oscillators of assessed quality
• IEC 60027, IEC 60050-561, IEC 60469, ISO 80000-1 - referenced terminology and units

Keywords: IEC 62884-2:2017, phase jitter measurement, phase noise, oscillator testing, DRO, FBAR, RMS jitter, jitter measurement methods.