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IEC 63150-1:2019 PDF

Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations

Название (английский):
IEC 63150-1:2019

Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 1: Arbitrary and random mechanical vibrations

Статус документа:
Действующий
Формат:
Электронный (PDF)
Количество страниц:
74
Дата публикации:
10 мая 2019 г.
Издание:
IEC IS 63150 edition 1 version 1
ICS:
31.080.99
Описание (английский):

IEC 63150-1:2019 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range. This document is applicable to vibration energy harvesting devices with different power generation principles (such as electromagnetic, piezoelectric, electrostatic, etc.) and with different non-linear behaviour to the external mechanical excitation.

Технические детали

Технический комитет
TC 47 - Semiconductor devices
SKU
IEC 63150-1:2019