Overview
IEC 63185:2025 specifies a precise method for measuring the complex permittivity of low-loss dielectric substrates at microwave and millimeter-wave frequencies. The standard utilizes the balanced-type circular disk resonator method, enabling accurate and broadband evaluation of dielectric properties for materials intended for advanced microwave and millimeter-wave electronic circuits and devices. This second edition updates and extends the method, reflecting recent technological advancements and measurement requirements in the electronics industry.
Key Topics
- Complex Permittivity Measurement: This standard focuses on measuring both the real and imaginary components of the relative permittivity, critical for characterizing dielectric substrates at high frequencies.
- Broadband Measurement Range: With the use of higher-order modes in a single balanced-type circular disk resonator, measurements can be performed over a broad frequency range-now extended up to 170 GHz.
- Non-Destructive Testing: The method allows for accurate, non-destructive evaluation of relative permittivity and loss tangent of dielectric plates.
- Advanced Mode-Matching Analysis: The procedure carefully accounts for the effects of excitation holes and fringing fields, ensuring measurement accuracy using advanced computational techniques.
- Waveguide Compatibility: Circular disk resonators with waveguide interfaces are now included, expanding testing flexibility.
- Quality and Calibration: The standard outlines calibration protocols for vector network analyzers and periodic checks to maintain measurement system quality and reliability.
Applications
IEC 63185:2025 offers significant value across a range of high-frequency material and component development sectors:
- Material Characterization: Essential for developers and manufacturers of dielectric substrates for microwave and millimeter-wave circuits, antennas, sensors, and integrated devices.
- Quality Assurance: Facilitates stringent quality assurance of low-loss materials during production and R&D, ensuring components meet required electromagnetic performance.
- R&D and Prototyping: Suitable for research laboratories and academic settings focused on developing advanced materials with tailored dielectric properties.
- Electronics and Telecommunications: Supports the innovation of substrate materials for high-speed communications, emerging 5G, 6G, automotive radar, aerospace, and medical device applications.
- Conformity Assessment: Provides a standardized approach for verifying material specifications in accordance with international industry requirements.
Related Standards
Implementation and comparison may involve reference to several related international standards:
- IEC 61338-1-3: Waveguide type dielectric resonators - Measurement methods for complex relative permittivity of dielectric resonator materials at microwave frequencies.
- IEC 62810: Cylindrical cavity methods for measuring the complex permittivity of low-loss dielectric rods.
- ISO/IEC Guide 98-3: General guidance on the expression of uncertainty in measurement.
- Electropedia (IEC 60050): For terminology associated with dielectric materials and measurement procedures.
Keywords: complex permittivity measurement, low-loss dielectric substrates, balanced-type circular disk resonator, microwave frequencies, millimeter-wave, IEC 63185, relative permittivity, loss tangent, material characterization, electronic substrate testing, broadband dielectric measurement.
By standardizing precision dielectric measurements up to 170 GHz, IEC 63185:2025 enables the electronics industry to advance reliable, high-performance materials for next-generation high-frequency applications.