Overview
IEC TR 62396-8:2020 is a Technical Report in the IEC 62396 series that provides awareness guidance on atmospheric radiation effects for avionics electronics. It focuses on small-particle fluxes - protons, electrons, pions, muons, alpha-rays - and single event effects (SEE) that can impact electronic equipment operating at altitudes up to 60 000 ft (18 300 m). The report describes the radiation environment, identifies potential failure mechanisms, and outlines methods for quantifying SEE rates in electronic components. As an emerging topic with limited test data, IEC TR 62396-8 is intended to raise technical awareness rather than impose prescriptive requirements.
Key topics and technical content
- Radiation environment description: detailed discussion of atmospheric secondary particles and typical spectra at avionics altitudes, with figures and data sources for proton, electron, muon, pion and neutron fluxes.
- Particle-specific considerations: behavior and properties of alpha particles, protons, muons, pions, low- and high-energy neutrons and their relevance to SEEs in electronics.
- Fault taxonomy: hierarchical view of fault → error → hazard → failure applicable to avionics systems exposed to radiation.
- SEE quantification methods: guidance on experimental approaches, cross-section data interpretation and estimation methods for single event upset, latchup and other radiation-induced faults.
- Test facilities and measurement methods: non-exhaustive lists of irradiation facilities (proton, muon, neutron, alpha sources) and measurement approaches for SEE testing.
- Informative annexes: practical background on CMOS device structures and general radiation effects (charge collection, spallation, neutron interactions).
Practical applications
This Technical Report supports practical activities such as:
- Design risk assessment for avionics hardware subject to atmospheric radiation.
- Component selection and qualification planning targeting SEE susceptibility.
- Test program development (irradiation campaigns and selection of appropriate particle sources and spectra).
- Reliability and safety cases for airborne electronic systems up to 60 000 ft.
- Research planning where existing data gaps need addressing for particle-specific SEE effects.
Who should use this standard
- Avionics OEMs and subsystem designers
- Hardware reliability and safety engineers
- Test labs and radiation test facility operators
- Aerospace electronics manufacturers and integrators
- Certification and compliance teams seeking awareness of atmospheric radiation impacts
Related standards
- Other parts of the IEC 62396 series (Process management for avionics – atmospheric radiation effects) cover complementary topics; consult the IEC webstore for the latest parts and updates.
Keywords: IEC TR 62396-8, atmospheric radiation, single event effects (SEE), avionics electronics, proton flux, muon, pion, alpha-ray, radiation testing, SEE rate quantification, avionics reliability.