IEC TR 62433-2-1:2010 PDF

Name: IEC TR 62433-2-1:2010 — EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
SKU: IEC TR 62433-2-1:2010
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EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

Название (английский):

IEC TR 62433-2-1:2010

EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 59
Дата публикации:: 5 октября 2010 г.
Издание:: IEC TR 62433 edition 1 version 1
ICS:: 31.200

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Срок поставки:10 раб. дн. (перевод)

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Описание (английский):

IEC/TR 62433-2-1:2010 covers black box modelling which has the potential to make the modelling of conducted emission very simple, very fast, and can provide complete protection of proprietary information of IC vendors. This technical report is intended to provide the theoretical background on black box modelling for IC conducted emission.

Abstract

Похожие стандарты

Упомянутые в описании и другие стандарты IEC

Overview

IEC TR 62433-2-1:2010 is a technical report published by the International Electrotechnical Commission (IEC) that focuses on Electromagnetic Compatibility (EMC) Integrated Circuit (IC) modelling, specifically the theory behind black box modelling for conducted emissions. This standard provides a theoretical foundation for efficiently simulating conducted emissions from ICs while fully protecting the proprietary information of IC vendors. Black box modelling offers a simplified and rapid approach to EMC analysis by representing complex IC behavior without detailed knowledge of internal circuit structures.

Key Topics

Black Box Modelling Concept This method models an IC’s emission behavior as a black box, capturing the essential input/output relationships without exposing internal details, ensuring vendor IP protection.

ICEM-CE Model Structure The report introduces the ICEM-CE model which divides the IC’s conducted emission behavior into two components:

Internal Activity (IA): Noise sources generated within the IC from switching activities.
Passive Distribution Network (PDN): Noise propagation path from internal terminals to external terminals.

Modeling Board Integration The IC model includes a modelling board that simulates real operational conditions by supplying power, input signals, and output loads. The modelling board interface is designed to be as simple and general as possible to avoid influencing measurement data unduly.

Parameter Extraction Techniques The technical report outlines methods to extract model parameters such as admittance matrices, equivalent internal activities, and passive network parameters. Specialized measurement setups and finite impedance terminations are employed for accurate parameter identification.

Matrix Compaction and Model Implementation Detailed discussions on admittance matrix compaction techniques reduce model complexity, enabling practical implementation. Guidelines for integration within simulation environments and handling noise voltage/current solutions are provided.

Applications

EMC Prediction for Semiconductor Devices Engineers can use the black box model to predict and mitigate conducted emissions from ICs in the design phase, reducing costly redesigns and EMC compliance testing iterations.

IP Protection for IC Vendors Vendors can provide detailed EMC behavior models without exposing circuit schematics or internal design, enabling collaboration with customers while preserving proprietary technology.

Efficient EMC Simulation in System Design System integrators benefit from fast, accurate IC emission models that simplify the analysis of conducted emissions in complex electronic assemblies, enhancing overall electromagnetic compatibility.

Educational and Research Use The theoretical insights support academic researchers and EMC professionals in studying and teaching advanced modelling strategies for conducted emissions.

Related Standards

IEC 62433 Series – EMC IC Modelling This technical report is part of the IEC 62433 series, which covers standards related to EMC modelling for integrated circuits, providing a comprehensive framework for IC EMC analysis.

IEC 61000 Series – EMC Testing and Measurement Complements the modelling approach by offering detailed standards for EMC measurement techniques and test methods.

ISO/IEC Directives Part 2 Governs the drafting and preparation of IEC standards ensuring international harmonization and technical rigor.

Summary

IEC TR 62433-2-1:2010 introduces a robust theoretical framework for black box modelling of conducted emissions in integrated circuits. By combining the ICEM-CE model structure with parameter extraction and matrix reduction techniques, this standard enables effective EMC simulation while safeguarding vendor intellectual property. Its practical applications span semiconductor design, electromagnetic compatibility compliance, and system integration, making it essential for engineers and researchers focused on EMC IC modelling. To ensure up-to-date practices, users should consult the latest editions and accompanying IEC publications related to EMC and semiconductor devices.

IEC TR 62433-2-1:2010 PDF

Abstract

Похожие стандарты

Overview

Key Topics

Applications

Related Standards

Summary

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