IEC TR 62572-2:2008 PDF

Name: IEC TR 62572-2:2008 — Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation
SKU: IEC TR 62572-2:2008
Price: 35 EUR
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Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation

Название (английский):

IEC TR 62572-2:2008

Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 28
Дата публикации:: 8 сентября 2008 г.
Издание:: IEC TR 62572 edition 1 version 1
ICS:: 31.260

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Описание (английский):

IEC/TR 62572-2:2008(E) provides guidance on: - the testing that a system supplier should ensure is in a place prior to procurement of a laser module from a laser module manufacturer; - a range of activities expected of a system supplier to verify a laser module manufacturer's reliability claims. This technical report deals with reliability assessment of laser modules used for telecommunication guidance on testing, use of failure criteria and reliability predictions is provided.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

IEC TR 62572-2:2008 - Fibre optic active components and devices: Reliability standards - Part 2: Laser module degradation is a technical report that provides guidance for the reliability assessment of laser modules used in telecommunications. It helps system suppliers (SS) verify laser module manufacturers’ (LMM) reliability claims and specifies the kinds of testing and verification activities a buyer should require prior to procurement. The report focuses on failure mechanisms, guidance on service‑life testing and screening (including burn‑in), use of failure criteria, and approaches for lifetime and failure‑rate prediction.

Key Topics

Failure mechanisms: Describes degradation sources affecting laser diodes and complete modules - e.g., semiconductor material defects, facet degradation, metallization and bond failures, monitor photodiode issues, TEC/thermistor failures, and packaging/fibre alignment instability.

Guidance on testing: Recommendations for service‑life testing, screening and burn‑in procedures, and scale of testing that a system supplier should expect from a manufacturer.

Failure criteria: How to define and apply electrical and optical failure limits during life tests (for example, monitoring threshold/operating current, optical output power and spectral changes).

Reliability predictions: Methods for lifetime and failure‑rate prediction, including statistical distributions (log‑normal) and use of activation energy for accelerated testing when experimentally determined values are not available.

Practical test considerations: Temperature cycling, high‑temperature storage and other environmental tests that influence module degradation and reliability assessment.

Figures and tables: Illustrative module cross‑sections, failure‑mode diagrams, example screening/test condition tables and failure‑criteria tables to support procurement and verification activities.

Applications and Who Uses It

IEC TR 62572-2 is intended for:

System suppliers (SS) procuring laser modules for telecommunications or data transmission equipment - to define procurement requirements and supplier verification plans.

Laser module manufacturers (LMMs) - to align reliability claims, test methods and reporting with buyer expectations.

Reliability and test engineers - for defining life tests, burn‑in, environmental screening and statistical analysis of field life.

Procurement, QA and design teams - for risk assessment, parts qualification and supplier audits in telecom, datacom, transport and aerospace systems employing fibre‑optic transmitters.

Practical uses include drafting detail specifications, designing qualification plans, interpreting life‑test data and setting pass/fail criteria for production modules.

Related Standards

Normative and related references cited in the report include:

IEC 60068‑2‑1, IEC 60068‑2‑14 (environmental testing)

IEC 60747‑1, IEC 60749‑1 (semiconductor device standards)

ISO 9000 (quality management fundamentals)

MIL‑STD‑883G (microcircuit test methods)

Keywords: IEC TR 62572-2:2008, laser module degradation, fibre optic active components, reliability assessment, laser module testing, failure mechanisms, lifetime prediction, telecommunications.

IEC TR 62572-2:2008 PDF

Abstract

Похожие стандарты

Overview

Key Topics

Applications and Who Uses It

Related Standards

Технические детали

BS EN IEC 60068-2-13:2021

Environmental testing - Tests. Test M: Low air pressure

IEC 60068-2-14:2009

Environmental testing - Part 2-14: Tests - Test N: Change of temperature

BS IEC 60747-12-3:1998

Discrete semiconductor devices and integrated circuits - Optoelectronic devices. Blank detail specification f…

IEC 60749-1:2002/COR1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 1: General

SIST EN ISO 9000:2015

Quality management systems - Fundamentals and vocabulary (ISO 9000:2015)