Overview
IEC TS 60871-2:2014 (consolidated as edition 3.1 with Amendment 1, 2022) is a Technical Specification from the IEC that defines endurance (ageing) testing for shunt capacitors for a.c. power systems having a rated voltage above 1 000 V. It complements IEC 60871-1 (general requirements) by specifying the purpose, test sequence and procedural requirements for ageing tests of capacitors and related fail‑safe checks for fuseless units.
Key topics and requirements
- Scope and purpose: The ageing test verifies that increased voltage stress at elevated temperature does not cause premature dielectric failure. It is intended to validate a dielectric system (not every individual rating).
- Test object: Applies to capacitors manufactured in accordance with IEC 60871-1; a defined test unit must be representative of production units (see Annex A for design limits).
- Test sequence and conditioning:
- Routine voltage test between terminals (frequency 50 Hz or 60 Hz; DC allowed for the routine test per IEC 60871-1 clause 9.3).
- Conditioning: subject test unit to at least 1.1 × rated voltage at ambient temperature not less than +10 °C for at least 16 hours to stabilize dielectric properties.
- Ageing (endurance) test:
- Initial and final capacitance and dielectric loss (tan δ) measurements are required; initial measurements at 0.9 to 1.1 times rated voltage.
- Ambient temperature during the ageing test shall be not less than 55 °C, with average dielectric temperatures typically exceeding 60 °C for covered designs.
- Acceptance criteria and validity rules are defined (see Clauses 4.3.3 and 4.4).
- Element fail‑safe testing: Specific procedures and circuits are included for fuseless capacitors, covering conditioning to provoke element failure, discharge tests, load current tests and voltage-withstand checks between terminals and container.
- Definitions: Terms such as test unit, comparable element design, and inter-element insulation are specified to ensure repeatable, comparable tests.
Applications and practical value
- Use this TS to:
- Validate dielectric systems and manufacturing processes for high‑voltage shunt capacitors.
- Produce manufacturer test certificates documenting endurance test results for purchasers.
- Design representative test units and select comparable element designs when qualifying new capacitor constructions.
- Practical users: capacitor manufacturers, R&D teams, quality engineers, test laboratories, and purchasers specifying endurance testing in procurement.
Who should use this standard?
- Manufacturers qualifying dielectric systems and production lines.
- Independent test laboratories performing endurance and fail‑safe testing.
- Utilities and OEMs specifying high‑voltage shunt capacitor performance and procurement acceptance tests.
Related standards
- IEC 60871-1:2014 - Shunt capacitors for a.c. power systems - Part 1: General (normative reference).
- IEC TR 60996 - Method for verifying accuracy of tan delta measurements applicable to capacitors.
- Note: the overvoltage cycling test was moved from this part to IEC 60871-1:2014 (significant change in this edition).
Keywords: IEC TS 60871-2:2014, ageing tests of capacitors, shunt capacitors, endurance testing, high‑voltage capacitors.