Overview
IEC TS 62607-11-1:2025 - "Nanomanufacturing - Key control characteristics - Part 11-1: Electromagnetic compatibility - Shielding effectiveness of nanomaterials: near-field probe method" is a Technical Specification from IEC that defines a standardized near-field measurement method for shielding effectiveness (SE) of nanomaterials (for example, carbon nanotubes (CNTs) and thin-film graphene). The document addresses the need to measure SE in the near-field region (approximately within λ/2π), where many modern devices and wearable electronics operate, and provides practical procedures, analysis methods and case studies.
Key topics and requirements
- Scope and purpose
- Standardized method for measuring SE of nanomaterials in the near-field region.
- Focus on thin-film nanomaterials including CNTs.
- Measurement principle
- SE expressed in decibels (dB) using power, electric-field (E) or magnetic-field (H) ratios (e.g., SE = 10 log(P1/P2), or 20 log(E1/E2)/20 log(H1/H2)).
- Requirement to measure both E-field and H-field dominance zones in the near-field.
- Sample preparation
- Samples should be measured “as delivered” by suppliers; thin films shall be prepared to specified thicknesses when required.
- Use of a holder/toggle-clamp arrangement to fix samples stably between gasket and ground during scanning.
- Apparatus and setup
- Near-field scanner (NFS) with scan table, near-field probes (NFP) for E and H, and a Vector Network Analyser (VNA).
- PC with analysis software for S-parameter conversion and SE calculation.
- Procedure and analysis
- Preparation and operating instructions for NFP/NFS, measurement locations, and conversion from S-parameters to SE (see informative Annex B).
- Reporting requirements: measurement conditions and data presentation formats.
- Annexes / Case studies
- Informative case studies demonstrating measured SE with near-field scanners and conversion examples.
Applications and who uses it
- Manufacturers of nanomaterial-based shielding (CNT, graphene thin films) validating product EMC performance.
- EMC/antenna engineers and test laboratories conducting near-field SE testing for compact or wearable devices.
- Materials scientists and nanomanufacturing R&D teams optimizing film thickness, deposition and multilayer structures for EMI shielding.
- OEMs of high-integrity electronics where near-field coupling and local shielding are critical.
Related standards
- IEC TS 61967-3 - Integrated circuits: radiated emissions surface scan method (near-field scanning references)
- IEC 61967-6 - Integrated circuits: conducted emissions - magnetic probe method
Keywords: IEC TS 62607-11-1:2025, shielding effectiveness, near-field probe, nanomaterials, carbon nanotubes, CNT, electromagnetic compatibility, near-field scanning, vector network analyser, thin film SE.