IEC TS 62607-6-17:2023 PDF

Overview - IEC TS 62607-6-17:2023 (Graphene order parameter by XRD & TEM)

IEC TS 62607-6-17:2023 defines a standardized method for measuring the order parameter of graphene-based material and layered carbon materials using X‑ray diffraction (XRD) and transmission electron microscopy (TEM). The order parameter quantifies structural ordering from two perspectives:

• z‑axis: derived from the full width at half maximum (FWHM) of the (002) peak in XRD spectra;
• x–y axis: derived from the FWHM of the (100) peak from selected area electron diffraction (SAED) patterns recorded on TEM.

The specification applies to graphene-based and layered carbon materials (for example, graphite, expanded graphite, amorphous/vitreous/glassy carbon) whose basic structure has been characterized by other techniques. Graphene oxide is outside the scope.

Key topics and technical requirements

• Measurement principle: Bragg diffraction in XRD for z‑axis ordering; SAED for x–y ordering.
• Peaks used: FWHM of XRD (002) and SAED (100) peaks as the primary metrics for the order parameter.
• Instrumentation: requirements and descriptions for XRD and TEM equipment, sample preparation methods, and ambient conditions during measurement.
• Calibration and uncertainty: guidance on calibration protocols, sources of measurement uncertainty and how to address them.
• Data analysis and reporting: standardized analysis procedures, calculation of order parameters, and recommended report formats (including informative annexes and a case study for data interpretation).
• Applicability: method can differentiate few‑layer graphene or reduced graphene oxide from other layered carbon materials.

Applications - who uses this standard

• Manufacturers and process engineers - for quality control and to ensure batch‑to‑batch reproducibility in nanomanufacturing of graphene and carbon materials.
• Quality control and metrology laboratories - to implement repeatable XRD/TEM protocols and report consistent order‑parameter metrics.
• Materials scientists and R&D teams - for material classification, screening of few‑layer graphene, and correlating structural order with properties (e.g., thermal behavior).
• Standards committees and procurement teams - to specify testable acceptance criteria for graphene‑based products.

Practical value and SEO keywords

This Technical Specification supports robust, repeatable characterization of graphene-based material, enabling reliable use of order parameter, XRD, TEM, SAED, and FWHM metrics in manufacturing and research. Relevant keywords: IEC TS 62607-6-17:2023, graphene order parameter, graphene characterization, XRD (002) peak, TEM SAED (100) peak, layered carbon materials, quality control, nanomanufacturing.

Related standards

• Other parts of the IEC TS 62607 (Nanomanufacturing – Key control characteristics) series provide complementary methods and context for nanomaterial characterization and quality control.