IEC TS 62607-6-27:2025 PDF

IEC TS 62607-6-27:2025, which is a Technical Specification, establishes a standardized method to determine the key control characteristic • field-effect mobility for semiconducting two-dimensional (2D) materials by the • field-effect transistor (FET) method. For two-dimensional semiconducting materials, the field-effect mobility is determined by fabricating a FET test structure and measuring the transconductance in a four-terminal configuration. - This method can be applied to layers of semiconducting two-dimensional materials, such as graphene, black phosphorus (BP), molybdenum disulfide (MoS₂), molybdenum ditelluride (MoTe₂), tungsten disulfide (WS₂), and tungsten diselenide (WSe₂). - The four-terminal configuration improves accuracy by eliminating parasitic effects from the probe contacts and cables