ISO 13383-2:2012 PDF

Overview

ISO 13383-2:2012 defines a manual, stereological method for determining the phase volume fraction in fine (advanced) ceramics by evaluating micrographs of polished and etched sections. The procedure overlays a transparent square grid on micrographs and counts grid-line intersections over each identifiable phase. It assumes area fractions on a random cross-section are equivalent to true volume fractions and is intended for ceramics containing distinct secondary phases (for example, Al2O3/ZrO2, Si/SiC, Al2O3/SiCw).

Key topics and requirements

• Scope and principle: Use of micrographs and the grid-intersection counting technique to estimate phase volume fractions (stereological basis).
• Sample preparation: Guidance on sampling, sectioning, mounting, grinding, polishing and etching to reveal phases without introducing artefacts (avoid grain pluck‑out).
• Apparatus: Requirements for sectioning equipment, mounting media, diamond-based grinding/polishing, optical or scanning electron microscope (SEM), and a transparent square grid (line thickness ≤ 0.1 mm).
• Microscopy selection:
  • Use SEM when phase grain size or glassy films are < 2 µm.
  • Optical microscopy acceptable for larger features; SEM or optical for 2–4 µm.
• Photomicrography and sampling:
  • At least three micrographs at sufficient magnification.
  • At least 100 features of any given type across the set of images.
  • Ensure representative sampling; survey multiple regions when microstructure is inhomogeneous.
• Counting method: Overlay a square grid and count intersections falling on each phase to compute area/volume fractions.
• Limitations & uncertainties:
  • Porosity treated as a secondary phase if not from polishing damage.
  • Porosity > ~20% risks artefacts during polishing.
  • Phases