ISO 15470:2017 PDF
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
Surface chemical analysis — X-ray photoelectron spectroscopy — Description of selected instrumental performance parameters
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 5
- Дата публикации:
- 2 марта 2017 г.
- Издание:
- ISO IS 15470 edition 2 version 1
- ICS:
- 71.040.40
ISO 15470:2017 describes the way in which specific aspects of the performance of an X-ray photoelectron spectrometer are described.
Abstract
Overview
ISO 15470:2017 provides a standardized framework for describing selected instrumental performance parameters of X-ray photoelectron spectrometers (XPS). Published as the second edition by ISO/TC 201/SC 7, the document aims to make manufacturer specifications and instrument data comparable and unambiguous for users and purchasers of XPS systems. It complements existing vocabularies and calibration methods referenced in and .
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