ISO 16592:2012 PDF
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 12
- Дата публикации:
- 31 июля 2012 г.
- Издание:
- ISO IS 16592 edition 2 version 1
- ICS:
- 71.040.50
ISO 16592:2012 gives guidance on a method for the determination of the carbon content in steels containing other alloying elements (less than 1 % to 2 % by mass) using the calibration curve method. It specifies the sample preparation, X-ray detection, establishment of the calibration curve and the procedure for the determination of the uncertainty of the measured carbon content. It is applicable to steels containing a mass fraction of carbon of less than 1,0 %. The method is not applicable to steels with higher carbon contents, which could significantly affect the accuracy of the analysis results. ISO 16592 applies to analyses performed using normal beam incidence and wavelength-dispersive X-ray spectrometry; it is not designed to be used for energy-dispersive X-ray spectrometry.
Abstract
Overview
ISO 16592:2012 provides practical guidance for determining the carbon content of steels (mass fraction < 1.0 %) by electron probe microanalysis (EPMA) using a calibration curve method. The standard covers specimen preparation, measurement of the C Kα X‑ray signal using wavelength-dispersive X‑ray spectrometry (WDS) at normal beam incidence, establishment of a calibration curve from certified reference materials, and procedures for evaluating measurement uncertainty. NOTE: ISO 16592:2012 is not intended for use with energy-dispersive X‑ray spectrometry (EDS) or steels with carbon > 1.0 %.
Key topics and technical requirements
- Scope and applicability: Applicable to low-carbon steels (
Технические детали
- Технический комитет
- ISO/TC 202/SC 2 - Electron probe microanalysis
- SKU
- ISO 16592:2012
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