ISO 17328:2021 PDF

Name: ISO 17328:2021 — Optics and photonics — Optical materials and components — Test method for refractive index of infrared optical materials
SKU: ISO 17328:2021
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Optics and photonics — Optical materials and components — Test method for refractive index of infrared optical materials

Название (английский):

ISO 17328:2021

Optics and photonics — Optical materials and components — Test method for refractive index of infrared optical materials

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 15
Дата публикации:: 30 ноября 2021 г.
Издание:: ISO IS 17328 edition 2 version 1
ICS:: 37.020

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Описание (английский):

This document provides a standard method for measuring the relative refractive index to the air of infrared materials used in the infrared spectral range from 0,78 µm to 25 µm. This document excludes methods for measuring the refractive index of birefringent materials and methods for measuring the complex refractive index.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

ISO 17328:2021 - Optics and photonics - provides a standardized test method for measuring the relative refractive index to air of infrared optical materials in the spectral range 0.78 µm to 25 µm. The standard specifies a minimum deviation method using a polished prism specimen, defines required apparatus and procedures, and sets out reporting and uncertainty practices. It excludes measurements for birefringent materials and methods for determining the complex refractive index.

Key topics and technical requirements

Measurement principle: Minimum deviation method - determine the apex angle (α) and the angle of minimum deviation (δ) and calculate the relative refractive index via the standard formula in the document.

Spectral range: 0.78 µm to 25 µm; wavelengths must sample adequately for dispersion curve fitting and derivation of index at arbitrary wavelengths.

Specimen: Wedged/prism shape with polished entrance and exit faces; apex angle guidance provided (α = 2 arctan(1/n_rel) as guidance).

Surface accuracy: Entrance and exit faces assessed with an interferometer; recommended surface flatness error is 150 nm P‑V or less over the clear aperture.

Apparatus (Annex A examples): collimated monochromatic light source (monochromator or band-pass filters), collimating unit, goniometer (rotating stage and arm), focusing unit, detector unit, and temperature/environment control.

Environmental control: Measure specimen and ambient temperature, pressure and humidity; method assumes stable ambient temperature for measurement.

Error analysis: Annex B provides analysis of angular and measurement errors and uncertainty reporting requirements.

Test report: Must include specimen identification (per ISO 11382), date/place, measurer, ambient conditions, apex angle, specimen temperature, surface accuracy, wavelengths and bandwidths, angles of minimum deviation, and calculated relative refractive indices - all with stated uncertainties.

Applications and users

ISO 17328:2021 is intended for:

Manufacturers and quality control of infrared optics and components (e.g., lenses, windows, prisms).

Optical material suppliers characterizing infrared optical materials (Ge, ZnS, ZnSe, chalcogenides, etc.).

Metrology and research laboratories performing refractive index measurements and dispersion characterization.

Optical designers and system engineers needing accurate refractive index data for modeling IR imaging, sensing, and photonics systems.

Keywords: ISO 17328:2021, refractive index, infrared optical materials, minimum deviation method, goniometer, prism, spectral range 0.78–25 µm, surface accuracy, test report.

ISO 17328:2021 PDF

Abstract

Похожие стандарты

Overview

Key topics and technical requirements

Applications and users

Related standards

Технические детали

ISO 11382:2010

Optics and photonics — Optical materials and components — Characterization of optical materials used in the i…

ISO 12123:2018

Optics and photonics — Specification of raw optical glass

BS ISO 11382:2022

Optics and photonics. Optical materials and components. Characterization of optical materials used in the inf…