ISO 18116:2005 PDF

Name: ISO 18116:2005 — Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis
SKU: ISO 18116:2005
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Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis

Название (английский):

ISO 18116:2005

Surface chemical analysis — Guidelines for preparation and mounting of specimens for analysis

Статус документа:: Отменён
Формат:: Электронный (PDF)
Количество страниц:: 16
Дата публикации:: 22 августа 2005 г.
Издание:: ISO IS 18116 edition 1 version 1
ICS:: 71.040.40

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Описание (английский):

ISO 18116:2005 gives guidance on methods of mounting and surface treatment for a specimen about to undergo surface chemical analysis. It is intended for the analyst as an aid in understanding the specialized specimen-handling conditions required for analyses by techniques such as Auger electron spectroscopy, secondary-ion mass spectrometry, and X-ray photoelectron spectroscopy.

Abstract

Похожие стандарты

Упомянутые в описании и другие стандарты ISO

Overview

ISO 18116:2005 - Surface chemical analysis - Guidelines for preparation and mounting of specimens for analysis - gives practical guidance for handling, mounting and surface treatment of specimens destined for surface‑sensitive chemical analysis. It is written for analysts using techniques such as Auger electron spectroscopy (AES), X‑ray photoelectron spectroscopy (XPS) and secondary‑ion mass spectrometry (SIMS), and is applicable to other surface‑sensitive methods where specimen handling can affect results. The standard emphasises preserving the original surface state and minimising contamination and damage prior to and during vacuum analysis.

Key topics and requirements

The standard addresses specimen handling and preparation topics that directly affect surface chemistry measurements:

Visual inspection and documentation: record residues, particles, adhesives and marks before analysis; mark locations without contaminating the area.

Specimen history and information needs: consider prior treatments and whether the target information is surface‑only or subsurface.

Sources of contamination: tools, gloves, mounts, gases, vacuum exposure and prior electron/ion/X‑ray irradiation - avoid materials that transfer to the specimen.

Storage and transfer: guidance on storage time, containers, temperature, humidity and safe transfer to analytical instruments.

Mounting procedures: methods for powders, wires, pedestals and fragile samples to ensure mechanical stability and analytical access.

Charging mitigation: use of conductive masks, coatings, grids or flood guns and beam management to reduce sample charging during AES/XPS/SIMS.

Specimen preparation techniques: mechanical separation, thinning, substrate removal, sectioning, growth of overlayers, solvent cleaning, chemical and plasma etching, ion sputtering and heating - with emphasis on avoiding alteration of the surface of interest.

Fracturing, cleaving and scribing: considerations for exposing uncontaminated internal surfaces.

Special handling: prepumping gassy specimens, viscous liquids and residues.

Practical applications and users

ISO 18116:2005 is used by:

Surface analysis scientists and technicians performing AES, XPS, SIMS and related measurements

Materials scientists, failure analysts and quality control labs preparing samples for surface chemistry characterization

Instrument manufacturers and lab managers developing standard operating procedures for vacuum analysis

Benefits include improved data reliability, reduced vacuum‑system contamination and consistent specimen‑handling practices that protect both sample integrity and instrument performance.

ISO 18116:2005 PDF

Abstract

Похожие стандарты

Overview

Key topics and requirements

Practical applications and users

Related standards

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