Name: ISO 22581:2021 — Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containing compounds
SKU: ISO 22581:2021
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ISO 22581:2021 PDF

Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containing compounds

Название (английский):

ISO 22581:2021

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 16
Дата публикации:: 12 марта 2021 г.
Издание:: ISO IS 22581 edition 1 version 1
ICS:: 71.040.40

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Описание (английский):

This document is provided to assist in the surface analysis of thin films on materials which are not thought to contain carbon compounds as intended components but for which a C1s peak is observed in the survey spectrum. The films can be those generated on metals and alloys by aerobic or electrochemical oxidation or be those deposited on inert substrates. The procedure described is not suitable for discontinuous deposits of particles on a substrate. With this exception, a simple procedure is provided for identifying the C1s signal from carbon-containing surface contamination. When the C1s peak is identified as arising from an adventitious over-layer the composition derived from the survey spectrum can be corrected for its influence. Recommended procedures are provided in the form of simple Rules structured in the 'If - Then` format with the intention that the information they embody might be utilised by automated procedures in data-systems. The rules provided utilize only information retrieved from the XPS survey scan.

Overview

ISO 22581:2021 gives rules for identifying and correcting carbon-containing surface contamination using the X‑ray photoelectron spectroscopy (XPS) survey scan. It is intended for near real‑time or automated interpretation of XPS survey spectra where a C1s peak appears on materials not expected to include carbon as an intended component. The standard provides a simple, structured approach (in If - Then rule format) to decide whether the C1s signal is adventitious contamination, estimate an overlayer’s thickness, and correct measured composition for its attenuation effect.

Key topics and requirements

Scope and limitations
- Applies to thin, continuous contamination films on metals, alloys or films on inert substrates.
- Not suitable for discontinuous particle deposits on substrates.
Data source
- Rules use only information from the XPS survey scan (recommended to include the C KVV Auger region).
- Recommended acquisition parameters cited (e.g., step size ≤ 0.4 eV as per IUVSTA guidance).
Rule set and decision logic
- Identification rules are expressed as straightforward If - Then statements, enabling machine implementation for automated systems.
- Criteria include presence of a C1s peak, expected sample composition (whether carbon is anticipated), spectral characteristics consistent with contamination, and evidence of a thin surface overlayer.
Correction and quantification
- Procedures for estimating film thickness and correcting substrate elemental intensities for attenuation by the carbon overlayer are provided.
- Rules support near real‑time adjustment of composition derived from the survey scan without expert intervention.
Practical considerations
- Notes on contamination sources (airborne organics, packaging, spectrometer vacuum), charging reference usage, and risks of ion sputter removal altering surface chemistry.
- Angle‑resolved XPS (ARXPS) can provide more detail but is not required by this standard.

Applications and users

Surface chemists, materials scientists, corrosion researchers, and quality‑control labs using XPS/X‑ray photoelectron spectroscopy to analyze thin films and surfaces.
Instrument manufacturers and software developers implementing automated spectral interpretation and near‑real‑time data reduction.
Laboratories needing standardized, reproducible procedures to identify adventitious carbon, estimate contamination thickness, and correct quantitative surface composition rapidly.

Related standards and guidance

References IUVSTA Workshop recommendations (acquisition guidance) and cross‑references ISO 19318 (charging correction considerations).
Prepared by ISO/TC 201 (Surface chemical analysis) - aligns with other XPS data‑management standards.

Keywords: ISO 22581:2021, XPS survey scan, C1s peak, adventitious carbon, surface contamination, film thickness correction, automated XPS analysis, near real‑time surface analysis.

ISO 22581:2021 PDF

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Abstract

Overview

Key topics and requirements

Applications and users

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