ISO 23833:2013 PDF
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
- Статус документа:
- Действующий
- Формат:
- Электронный (PDF)
- Количество страниц:
- 27
- Дата публикации:
- 5 апреля 2013 г.
- Издание:
- ISO IS 23833 edition 2 version 1
- ICS:
- 01.040.71
ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order. ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.
Abstract
Overview
ISO 23833:2013 - "Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary" defines and standardizes the terminology used in electron probe microanalysis (EPMA). The standard provides systematic, hierarchical definitions for general and specific concepts used in EPMA practice and is intended for use across EPMA-related standardization documents. Parts of ISO 23833:2013 also apply to related microbeam techniques (SEM, AEM, EDX/EDS, WDS/WDX) for terms common to those fields.
Key topics and requirements
ISO 23833:2013 establishes consistent definitions for terms that describe:
- EPMA concepts and modes: EPMA qualitative and EPMA quantitative (identification vs quantitative concentration assignment).
- Instrumentation: microprobe/microsonde, spectrometers (WDS/WDX, EDS/EDX) and positioning optics.
- Electron–matter interactions: elastic and inelastic scattering, backscattered electrons (BSE), secondary electrons (SE - conventionally
Технические детали
- Технический комитет
- ISO/TC 202/SC 1 - Terminology
- SKU
- ISO 23833:2013
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