ISO 5490:2025 PDF

Name: ISO 5490:2025 — Steel — Rating and classifying nonmetallic inclusions using the scanning electron microscope
SKU: ISO 5490:2025
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Steel — Rating and classifying nonmetallic inclusions using the scanning electron microscope

Название (английский):

ISO 5490:2025

Steel — Rating and classifying nonmetallic inclusions using the scanning electron microscope

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 19
Дата публикации:: 26 сентября 2025 г.
Издание:: ISO IS 5490 edition 1 version 1
ICS:: 77.080.20

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Описание (английский):

This document specifies procedures for the rating and statistical analysis of non-metallic inclusions (referred to as inclusions hereafter) using a scanning electron microscope (SEM) with an energy dispersive X-ray spectrometer (EDS), a backscattered detector (BSD) and automatic image analysis capabilities.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

ISO 5490:2025 - "Steel - Rating and classifying nonmetallic inclusions using the scanning electron microscope" - specifies standardized procedures for detecting, rating and statistically analysing non‑metallic inclusions in steel using an automated scanning electron microscope (SEM) equipped with an energy dispersive X‑ray spectrometer (EDS), a backscattered electron detector (BSD) and automatic image‑analysis software. The standard defines two main approaches: morphology (shape/size) or chemistry‑based rating and a statistical analysis method for stereological measurements.

Key topics and requirements

Equipment & software: automated, computer‑controlled SEM with EDS and BSD; light‑element detector required if analysing C, B or N. EDS performance must meet ISO 22309.

Calibration & checks: magnification calibration per ISO 16700; periodic EDS performance checks (e.g. ISO 15632 / ISO 22309); beam current adjusted to keep dead time < 40%.

Analysis modes:

Morphology rating: automated image analysis classifies inclusions by shape/size (AR threshold of 3 suggested for elongated particles) and chemistry as auxiliary input to reproduce ISO 4967 ratings.
Chemistry rating: classifies primarily by elemental composition (may yield different ratings from ISO 4967 if chemistry is primary).
Statistical analysis: reports area fraction, number per mm2, size distributions and chemical classes without producing ISO‑style ratings.

Imaging & measurement parameters: magnification and resolution chosen so minimum particle (e.g., 2 µm) has adequate pixels (pixel size ≤ 1 µm, preferably < 0.6 µm). Suggested accelerating voltage for EDS ~15–20 kV. Spectrum acquisition counts typically set high enough (example: > 3 000 counts) for reliable classification.

Automated rules: grey‑level thresholds for separating inclusions from matrix, rules for connecting stringers across field boundaries, and criteria for peak significance in EDS spectra (document provides example peak/background criteria).

Applications and users

ISO 5490:2025 is intended for:

Metallurgical laboratories and quality control teams in steel mills for inclusion rating and process control.

Failure analysis and R&D teams requiring objective, automated inclusion quantification.

Suppliers and OEMs specifying inclusion limits for critical components (bearing steels, structural steels, forgings).

Accreditation and inspection bodies seeking standardized SEM‑based inclusion data.

Practical benefits include reproducible automated ratings, faster large‑area analysis, and flexible statistical reporting tailored to application needs.

Related standards

ISO 4967 - Micrographic method using standard diagrams (sampling & rating)

ISO 15632 - EDS performance parameters

ISO 16700 - SEM magnification calibration

ISO 22309 - Quantitative EDS analysis and detector requirements

Keywords: ISO 5490:2025, steel inclusions, SEM analysis, EDS, BSD, automatic image analysis, morphology rating, chemistry rating, statistical analysis.

ISO 5490:2025 PDF

Abstract

Похожие стандарты

Overview

Key topics and requirements

Applications and users

Related standards

Технические детали

ISO 22309:2006

Microbeam analysis — Quantitative analysis using energy-dispersive spectrometry (EDS)

BS ISO 16700:2016

Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification.

ISO 15632:2002

Microbeam analysis — Instrumental specification for energy dispersive X-ray spectrometers with semiconductor…

ISO 4967:1998

Steel — Determination of content of nonmetallic inclusions — Micrographic method using standard diagrams