ISO/FDIS 20171 PDF
Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electron microscopy(TIFF/SEM)
Microbeam analysis — Scanning electron microscopy — Tagged image file format for scanning electron microscopy(TIFF/SEM)
- Статус документа:
- Отменён
- Формат:
- Электронный (PDF)
- Количество страниц:
- 35
- Издание:
- ISO IS 20171 edition 1 version 1
- ICS:
- 35.240.70
- Технический комитет:
- ISO/TC 202/SC 4 - Scanning electron microscopy
Технические детали
- SKU
- ISO/FDIS 20171
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