ISO/IEC 10536-1:2000 PDF

Overview

ISO/IEC 10536-1:2000 defines the physical characteristics for close-coupled contactless integrated circuit cards (CICC). It applies to ID-1 format cards (the credit-card size) designed to operate either in a slot or on the surface of a coupling device. Part 1 is the foundational physical-specification document and is intended to be used together with later parts of ISO/IEC 10536 that address dimensions, signalling and protocols.

Key topics and requirements

• Card type: ID-1 physical characteristics per ISO/IEC 7810 are required for CICC.
• Form factor and dimensions: Nominal dimensions follow the ID-1 card type (credit-card size).
• Environmental and mechanical robustness:
  • Operating temperature: 0 °C to 50 °C.
  • Dynamic bending stress: survive test deflections of hA = 20 mm (short axis) and hB = 10 mm (long axis) per ISO/IEC 10373.
  • Dynamic torsional stress: survive rotation up to α = 15°.
• Electromagnetic tolerance:
  • Alternating magnetic fields: must operate after exposure to specified average magnetic field strengths across frequency bands (see standard tables for 0.3–300 MHz).
  • Alternating electric fields: must operate after exposure to specified average electric field strengths across frequency bands.
  • Static magnetic field: withstand 640 kA/m (note: strong fields may erase magnetic stripe data).
  • Electrostatic discharge (ESD): meet tests referencing IEC 61000-4-2 with a 6 kV test voltage.
• Radiation and light exposure:
  • X-rays: continue to operate after cumulative exposure of 0.1 Gy/year in the 70–140 keV range.
  • Ultra-violet: no extra protection mandated beyond ordinary daylight; any higher UV protection is the manufacturer’s responsibility.
• Manufacturing considerations: Annex B recommends surface quality suitable for overprinting/customisation.

Applications and who uses this standard

ISO/IEC 10536-1 is used by:

• Card manufacturers designing physical card layers and embedding coupling means.
• Reader/writer (CCD) designers ensuring compatibility with close-coupled cards.
• Systems integrators and issuers (financial services, transit, access control, government ID) who need reliable card behaviour in real-world environments.
• Test laboratories and certification bodies conducting mechanical, environmental and EMC testing per referenced methods. Practical benefits include predictable durability, interoperability with coupling devices, and guidance for manufacturing and testing.

Related standards

• ISO/IEC 10536 (series) - Parts 2, 3 and 4: dimensions/coupling areas; electronic signals/reset; ATR/transmission protocols.
• ISO/IEC 7810, ISO/IEC 10373, IEC 61000-4-2 (testing and physical card requirements).
• Compatibility references: ISO/IEC 7811, 7812, 7813, 7816, 14443, 15693 (see Annex A).

Keywords: ISO/IEC 10536-1:2000, close-coupled cards, contactless integrated circuit cards, physical characteristics, ID-1 cards, card manufacturing, card testing.