ISO/TR 17055:2002 PDF

Steel — Determination of silicon content — Inductively coupled plasma atomic emission spectrometric method

Название (английский):

ISO/TR 17055:2002

Steel — Determination of silicon content — Inductively coupled plasma atomic emission spectrometric method

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 9
Дата публикации:: 2 мая 2002 г.
Издание:: ISO TR 17055 edition 1 version 1
ICS:: 77.080.20

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Описание (английский):

ISO/TR 17055 specifies a method for the determination of the content of silicon in steel by means of inductively coupled plasma emission spectrometry. The method is applicable to silicon contents of mass fraction 0,02 % to 5 %. The method uses a calibration based on a very close matrix matching of the calibration solutions to the sample and close bracketing of the contents around the approximate concentration of silicon in the sample to be analysed. The concentrations of all elements in the sample has, therefore, to be approximately known. If the concentrations are not known the sample has to be analysed by some semi quantitative method.

Технические детали

Технический комитет: ISO/TC 17/SC 1 - Methods of determination of chemical composition
SKU: ISO/TR 17055:2002

Abstract

Overview - ISO/TR 17055:2002 (Steel - Silicon by ICP-AES)

ISO/TR 17055:2002 describes a validated laboratory procedure for determining silicon content in steel using inductively coupled plasma atomic emission spectrometry (ICP-AES / ICP-OES). The method is applicable for silicon mass fractions from 0.02 % to 5 % and emphasizes matrix‑matched calibration and close bracketing of calibration concentrations around the sample to automatically compensate matrix interferences and improve accuracy.

Key topics and technical requirements

Scope and range: Applicable for Si content 0.02–5 % by mass.
Sample dissolution: Steel sample (~0.25 g) dissolved in a mixture of hydrochloric, nitric and hydrofluoric acids, then diluted to a known volume (100 ml polypropylene flask).
Calibration strategy: Requires very close matrix matching of calibration solutions to the sample and preparation of low/high calibration solutions that bracket the sample concentration. If sample matrix composition is unknown, a semi‑quantitative pre‑analysis is required.
Internal standard: Addition of a chosen internal standard element and simultaneous measurement of analyte and internal standard intensities is part of the protocol (exact element to be selected by the laboratory).
Instrument performance criteria:
- Recommended Si analytical lines include 251.61 nm and 288.16 nm (with known spectral interferences such as Mo, Mn, Cr listed in the report).
- Bandwidth (resolution) should be

Overview - ISO/TR 17055:2002 (Steel - Silicon by ICP-AES)

Key topics and technical requirements

Scope and range: Applicable for Si content 0.02–5 % by mass.
Sample dissolution: Steel sample (~0.25 g) dissolved in a mixture of hydrochloric, nitric and hydrofluoric acids, then diluted to a known volume (100 ml polypropylene flask).
Calibration strategy: Requires very close matrix matching of calibration solutions to the sample and preparation of low/high calibration solutions that bracket the sample concentration. If sample matrix composition is unknown, a semi‑quantitative pre‑analysis is required.
Internal standard: Addition of a chosen internal standard element and simultaneous measurement of analyte and internal standard intensities is part of the protocol (exact element to be selected by the laboratory).
Instrument performance criteria:
- Recommended Si analytical lines include 251.61 nm and 288.16 nm (with known spectral interferences such as Mo, Mn, Cr listed in the report).
- Bandwidth (resolution) should be

ISO/TR 17055:2002 PDF

Технические детали

Abstract

Overview - ISO/TR 17055:2002 (Steel - Silicon by ICP-AES)

Key topics and technical requirements

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Abstract

Overview - ISO/TR 17055:2002 (Steel - Silicon by ICP-AES)

Key topics and technical requirements

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