ISO/TS 10797:2012 PDF

Name: ISO/TS 10797:2012 — Nanotechnologies — Characterization of single-wall carbon nanotubes using transmission electron microscopy
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Nanotechnologies — Characterization of single-wall carbon nanotubes using transmission electron microscopy

Название (английский):

ISO/TS 10797:2012

Nanotechnologies — Characterization of single-wall carbon nanotubes using transmission electron microscopy

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 33
Дата публикации:: 29 мая 2012 г.
Издание:: ISO TS 10797 edition 1 version 1
ICS:: 07.030

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Описание (английский):

ISO/TS 10797:2012 establishes methods for characterizing the morphology of single-wall carbon nanotubes (SWCNTs) and identifying the elemental composition of other materials in SWCNT samples, using transmission electron microscopy and chemical analysis by energy dispersive X-ray spectrometry.

Abstract

Похожие стандарты

Стандарты, упомянутые в описании

Overview

ISO/TS 10797:2012 - Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy - defines standardized methods for using transmission electron microscopy (TEM) and energy dispersive X‑ray spectrometry (EDS) to characterize the morphology and non‑carbon elemental composition of single‑wall carbon nanotube (SWCNT) samples. The Technical Specification covers imaging, sample preparation, measurement procedures, data analysis and reporting to produce consistent, comparable TEM/EDS results for SWCNTs (and is applicable to multiwall CNTs in many respects).

Key topics and technical requirements

Scope and purpose: Procedures to characterize SWCNT morphology and identify other materials (e.g., catalyst residues, impurities) using TEM and chemical analysis by EDS.

Imaging modes: Guidance on TEM and high‑resolution TEM (HRTEM) imaging, bright‑field, dark‑field and high‑angle annular dark‑field (HAADF) approaches to resolve graphene wall structure, tube diameter, bundle morphology, defects and orientation.

Analytical methods: Use of TEM‑based EDS for elemental identification and semi‑quantitative analysis at the nanometre scale; discussion of complementary techniques such as selected area electron diffraction (SAED) and electron energy loss spectroscopy (EELS).

Sample preparation: Practical procedures for preparing powders, films, liquid suspensions and composites on suitable TEM grids to ensure representative, electron‑transparent specimens.

Measurement procedures: Systematic examination workflows (TEM imaging, EDS point/line/area analyses), magnification and calibration considerations, and limitations (e.g., length measurement constraints).

Data handling and reporting: Principles for interpreting TEM and EDS data, reporting formats, and recommendations to support reproducibility and inter‑laboratory comparison.

Annexes and case studies: Informative annexes provide additional sample‑preparation guidance, observation factors, and example case studies.

Applications and who uses it

ISO/TS 10797:2012 is intended for:

Research laboratories and academic groups studying CNT structure and properties.

Industrial R&D and manufacturers producing or incorporating SWCNTs who need quality assessment (morphology, purity).

Analytical and testing laboratories seeking standardized TEM/EDS protocols for SWCNT characterization and semi‑quantitative elemental analysis.

Regulatory bodies and certification labs requiring consistent reporting and traceable measurement procedures. Practical applications include purity assessment, catalyst residue identification, bundle and diameter analysis, defect and chirality studies, and comparative quality control of nanomaterials.

Related standards

ISO 22493 - Microbeam analysis - Scanning electron microscopy - Vocabulary

ISO 29301 - Analytical TEM - Methods for calibrating image magnification

ISO/TS 80004‑3 - Nanotechnologies - Vocabulary - Part 3: Carbon nano‑objects

ISO/IEC 17025 - Competence of testing and calibration laboratories

Keywords: ISO/TS 10797:2012, nanotechnologies, SWCNT, single‑wall carbon nanotubes, TEM, HRTEM, EDS, TEM/EDS characterization, sample preparation, CNT morphology, elemental analysis.

ISO/TS 10797:2012 PDF

Abstract

Похожие стандарты

Overview

Key topics and technical requirements

Applications and who uses it

Related standards

Технические детали

BS ISO 22493:2014

Microbeam analysis. Scanning electron microscopy. Vocabulary.

ISO 29301:2010

Microbeam analysis — Analytical transmission electron microscopy — Methods for calibrating image magnificatio…

SIST-TS CEN ISO/TS 80004-3:2021

Nanotechnologies - Vocabulary - Part 3: Carbon nano-objects (ISO/TS 80004-3:2020)

ISO 6141:2015/Amd 1:2020

Gas analysis — Contents of certificates for calibration gas mixtures — Amendment 1: Cross reference list to I…