Overview
ISO/TS 10867:2019 - "Nanotechnologies - Characterization of single‑wall carbon nanotubes using near infrared photoluminescence spectroscopy" provides guidelines and a measurement method for characterizing single‑wall carbon nanotubes (SWCNTs) by near infrared (NIR) photoluminescence (PL) spectroscopy. The technical specification defines how to determine the chiral indices (n,m) of semiconducting SWCNTs in a sample and to measure their relative integrated PL intensities. It also explains how measured PL intensities can be used, together with PL cross‑section information, to estimate relative mass concentrations of semiconducting SWCNT species.
Key topics and technical requirements
- Principles: Band‑gap photoluminescence, van Hove singularities, exciton effects and how PL peak positions relate to SWCNT structure (chiral vector and chiral angle).
- Instrumentation (NIR‑PL apparatus):
- Typical detector range: 800–1600 nm for CVD‑grown SWCNTs; 1200–2000 nm for larger diameters (laser‑vaporized or arc‑produced). Suggested detectors: InGaAs, InP/InGaAs.
- Light sources: monochromated lamps, Ti‑Sapphire lasers, fixed‑wavelength diode lasers, white‑light lasers.
- Spectral resolution guidance (multi‑channel systems ~5 nm; bandpass ~10 nm often sufficient).
- Sample preparation:
- Liquid dispersions: recommended use of D2O as dispersing medium, surfactants such as sodium deoxycholate (SDC), SDS, SDBS or SC; sonication, ultracentrifugation; adjust optical density (OD < 0.1 per cm at excitation) and pH ≈ 8.
- Solid films for long‑wavelength PL (>1800 nm): prepare supernatant and cast with gelatin on quartz substrates.
- Measurement procedures: acquisition of excitation/emission maps, assignment of PL peaks to specific (n,m) using empirical rules, determination of relative integrated intensities.
- Data analysis & uncertainty: procedures for structural assignment, conversion to relative mass concentrations (requires PL cross‑section knowledge), and guidance on reporting uncertainty and test reports.
- Normative references: ISO/TS 80004‑4 and ISO/TS 80004‑6 (nanotechnology vocabulary and nano‑object characterization).
Applications and users
- Laboratories and researchers performing SWCNT characterization and structure assignment.
- Quality control and R&D in nanomaterials manufacturing (CVD, laser‑vaporization, arc).
- Developers of optoelectronic devices, sensors, and biomedical nanotube applications who need reliable chirality and concentration data.
- Instrument manufacturers and standards bodies seeking harmonized NIR‑PL measurement protocols.
Related standards
- ISO/TS 80004‑4 - Nanotechnologies - Vocabulary (nanostructured materials)
- ISO/TS 80004‑6 - Nanotechnologies - Vocabulary (nano‑object characterization)
Keywords: ISO/TS 10867:2019, SWCNT characterization, near infrared photoluminescence spectroscopy, NIR‑PL, chiral indices, single‑wall carbon nanotubes, PL cross‑section, nanotechnology standards.