ISO TS 22292:2021 PDF

Name: ISO TS 22292:2021 — Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy
SKU: ISO TS 22292:2021
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Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

Название (английский):

ISO TS 22292:2021

Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

Статус документа:: Действующий
Формат:: Электронный (PDF)
Количество страниц:: 43
Дата публикации:: 14 июня 2021 г.
Издание:: IEC TS 22292 edition 1 version 1
ICS:: 07.120

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Описание (английский):

ISO TS 22292:2021 This document provides guidance for sample preparation, data acquisition by transmission electron microscopy, data processing, and three-dimensional image reconstruction to measure size and shape parameters of nano-objects on rod-shaped supports. The method is applicable to samples dispersed on or within an electron-transparent rod-shaped support.

Abstract

Похожие стандарты

Упомянутые в описании и другие стандарты ISO

Overview

ISO/TS 22292:2021 - Nanotechnologies: 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy (TEM) - is a technical specification that provides practical guidance for producing reliable three‑dimensional reconstructions of nano-objects supported on electron‑transparent rod-shaped supports. The document covers the workflow from sample preparation, through TEM data acquisition, to image alignment, 3D reconstruction, and extraction of size and shape measurands for nanoparticles and other nano-objects in the nanoscale (≈1 nm to 100 nm).

Key topics and requirements

Scope and applicability

Procedures apply to samples dispersed on or within an electron‑transparent, rod‑shaped support; useful for detailed 3D analysis of a limited number of objects.

Sample considerations

Guidance on choosing rod diameter and sample preparation variants (including options that enable combined 2D TEM and 3D analysis).

Instrument factors and TEM/STEM setup

Recommendations on microscope configuration, calibration, accelerating voltage, collection/convergence angles, magnification, detector pixels and acquisition timing. An informative annex covers STEM variations.

Data acquisition

Procedures for acquiring tilt-series 2D projections suitable for tomography.

Data alignment and volume reconstruction

Steps for aligning projections, reconstructing 3D volumes and software considerations (Annex C references tomography and visualization software).

Reconstructed volume evaluation

Identification of individual nanoparticles, thresholding strategies to extract measurands (size, shape, volume) and evaluation of reconstructed volumes.

Expression of results and uncertainty

Guidance on extracting parameters for well-separated objects, constructing an uncertainty budget and identifying error sources, including sample representativeness, 2D projection limitations, instrument calibration, alignment and reconstruction artefacts.

Informative case studies and annexes

Practical examples (metal and organic nanoparticles), microscope data-collection parameters, reconstruction method comparisons and uncertainty examples.

Applications and users

ISO/TS 22292:2021 is intended for:

Nanomaterials researchers and TEM facility staff performing electron tomography.

Metrology and quality‑control laboratories validating nanoparticle size and shape.

Manufacturers of nanomaterials and nanoscale devices requiring site‑specific 3D characterization.

Instrument and software developers working on TEM/STEM tomography workflows. Typical applications include detailed nanoparticle morphology analysis, validation of nanoscale reference materials, calibration of nanoscale measurement tools, and buried-interface characterization.

Related standards

Relevant referenced documents include:

ISO 21363 - particle size and shape by TEM

ISO/TS 80004 series - nanotechnology vocabulary

ISO/IEC Guide 99 - metrology vocabulary These provide complementary terminology, measurement vocabularies and TEM characterization methods aligned with ISO/TS 22292:2021.

Keywords: ISO TS 22292:2021, TEM tomography, 3D image reconstruction, rod-supported nano-objects, nanoparticle characterization, nanoscale metrology, STEM.

ISO TS 22292:2021 PDF

Abstract

Похожие стандарты

Overview

Key topics and requirements

Applications and users

Related standards

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